Abstract
Finite state machines have been used to model a wide variety of systems, including sequential circuits, and more recently, communication protocols. In testing problems we are given a system M, which we may test by providing inputs and observing the outputs produced. The goal is to design test sequences so that we can deduce desired information, such as the state of M, or whether M implements correctly a given specification machine S. In this paper we will discuss algorithmic work on basic testing problems for systems modeled by different types of finite state machines.
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References
Agrawal, V.D., Seth, S.C.: Test Generation for VLSI Chips. Computer Society Press (1988)
Aho, A.V., Dahbura, A.T., Lee, D., Uyar, M.U.: An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tours. IEEE Trans. on Communication 39(11), 1604–1615 (1991)
Alur, R., Courcoubetis, C., Yannakakis, M.: Distinguishing tests for nondeterministic and probabilistic machines. In: Proc. 27th Ann. ACM Symp. on Theory of Computing, pp. 363–372 (1995)
Angluin, D.: Learning regular sets from queries and counter examples. Inform. and Comp. 75, 87–106 (1987)
International standard ISO 8802-2, ANSI/IEEE std 802.2 (1989)
Apfelbaum, L.: Automated functional test generation. In: Proc. IEEE Autotestcon Conference (1995)
Chan, W.Y.L., Vuong, S.T., Ito, M.R.: An improved protocol test generation procedure based on UIOs. In: Proc. SIGCOM, pp. 283–294 (1989)
Chanson, S.T., Zhu, J.: A unified approach to protocol test sequence generation. In: Proc. INFOCOM, pp. 106–114 (1993)
Chen, M.-S., Choi, Y., Kershenbaum, A.: Approaches utilizing segment overlap to minimize test sequences. In: Logrippo, L., Probert, R.L., Ural, H. (eds.) Proc. IFIP WG6.1 10th Intl. Symp. on Protocol Specification, Testing, and Verification, pp. 85–98. North-Holland, Amsterdam (1990)
Chow, T.S.: Testing software design modeled by finite-state machines. IEEE Trans. on Software Engineering SE-4(3), 178–187 (1978)
Edmonds, J., Johnson, E.L.: Matching, Euler tours and the Chinese postman. Mathematical Programming 5, 88–124 (1973)
Friedman, A.D., Menon, P.R.: Fault Detection in Digital Circuits. Prentice-Hall, Englewood Cliffs (1971)
Hennie, F.C.: Fault detecting experiments for sequential circuits. In: Proc. 5th Ann. Symp. Switching Circuit Theory and Logical Design, pp. 95–110 (1964)
Holzmann, G.J.: Design and Validation of Computer Protocols. Prentice-Hall, Englewood Cliffs (1991)
Knightson, K.G.: OSI Protocol Conformance Testing. McGraw Hill, New York (1993)
Kohavi, Z.: Switching and Finite Automata Theory, 2nd edn. McGraw-Hill, New York (1978)
Kurshan, R.P.: Computer-aided Verification of Coordinating Processes. Princeton University Press, Princeton (1995)
Lee, D., Sabnani, K.K., Kristol, D.M., Paul, S.: Conformance testing of protocols specified as communicating finite state machines - a guided random walk based approach. IEEE Trans. on Communications 44(5), 631–640 (1996)
Lee, D., Yannakakis, M.: On-line minimization of transition systems. In: Proc. 24th Ann. ACM Symp. on Theory of Computing, pp. 264–274 (1992)
Lee, D., Yannakakis, M.: Testing finite state machines: state identification and verification. IEEE Trans. on Computers 43(3), 306–320 (1994)
Lee, D., Yannakakis, M.: Principles and Methods of Testing Finite State Machines - a Survey. Proceedings of IEEE 84(8), 1089–1123 (1996)
Lee, D., Yannakakis, M.: Optimization Problems from Feature Testing of Communication Protocols. In: Proc. of Intl. Conf. on Network Protocols, pp. 66–75 (1996)
Lee, D., Yannakakis, M.: in preparation
Lee, D., Yannakakis, M.: Pithia - An automatic test generation software tool for communication systems (in preparation)
Miller, R.E., Paul, S.: On the generation of minimal length test sequences for conformance testing of communication protocols. IEEE/ACM Trans. on Networking 1(1), 116–129 (1993)
Moore, E.F.: Gedanken-experiments on sequential machines. In: Automata Studies, Annals of Mathematics Studies, vol. 34, pp. 129–153. Princeton University Press, Princeton (1956)
Naito, S., Tsunoyama, M.: Fault detection for sequential machines by transitions tours. In: Proc. IEEE Fault Tolerant Comput. Symp., pp. 238–243. IEEE Computer Society Press, Los Alamitos (1981)
Rivest, R.L., Schapire, R.E.: Inference of finite automata using homing sequences. In: Proc. 21st Ann. Symp. on Theory of Computing, pp. 411–420 (1989)
Sabnani, K.K., Dahbura, A.T.: A protocol test generation procedure. Computer Networks and ISDN Systems 15(4), 285–297 (1988)
Sarikaya, B., Bochmann, G.v.: Synchronization and specification issues in protocol testing. IEEE Trans. on Commun. COM-32(4), 389–395 (1984)
Sidhu, D.P., Leung, T.-K.: Formal methods for protocol testing: a detailed study. IEEE Trans. Soft. Eng. 15(4), 413–426 (1989)
Sokolovskii, M.N.: Diagnostic experiments with automata. Kibernetika 6, 44–49 (1971)
Uyar, M.U., Dahbura, A.T.: Optimal test sequence generation for protocols: the Chinese postman algorithm applied to Q.931. In: Proc. IEEE Global Telecommunications Conference (1986)
Vasilevskii, M.P.: Failure diagnosis of automata. Kibernetika 4, 98–108 (1973)
Yang, B., Ural, H.: Protocol conformance test generation using multiple UIO sequences with overlapping. In: Proc. SIGCOM, pp. 118–125 (1990)
Yannakakis, M., Lee, D.: Testing finite state machines: fault detection. J. of Computer and System Sciences 50(2), 209–227 (1995)
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Yannakakis, M., Lee, D. (1999). Testing of Finite State Systems. In: Gottlob, G., Grandjean, E., Seyr, K. (eds) Computer Science Logic. CSL 1998. Lecture Notes in Computer Science, vol 1584. Springer, Berlin, Heidelberg. https://doi.org/10.1007/10703163_3
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DOI: https://doi.org/10.1007/10703163_3
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-65922-8
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