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Testing of Finite State Systems

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Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 1584))

Abstract

Finite state machines have been used to model a wide variety of systems, including sequential circuits, and more recently, communication protocols. In testing problems we are given a system M, which we may test by providing inputs and observing the outputs produced. The goal is to design test sequences so that we can deduce desired information, such as the state of M, or whether M implements correctly a given specification machine S. In this paper we will discuss algorithmic work on basic testing problems for systems modeled by different types of finite state machines.

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References

  1. Agrawal, V.D., Seth, S.C.: Test Generation for VLSI Chips. Computer Society Press (1988)

    Google Scholar 

  2. Aho, A.V., Dahbura, A.T., Lee, D., Uyar, M.U.: An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tours. IEEE Trans. on Communication 39(11), 1604–1615 (1991)

    Article  Google Scholar 

  3. Alur, R., Courcoubetis, C., Yannakakis, M.: Distinguishing tests for nondeterministic and probabilistic machines. In: Proc. 27th Ann. ACM Symp. on Theory of Computing, pp. 363–372 (1995)

    Google Scholar 

  4. Angluin, D.: Learning regular sets from queries and counter examples. Inform. and Comp. 75, 87–106 (1987)

    Article  MATH  MathSciNet  Google Scholar 

  5. International standard ISO 8802-2, ANSI/IEEE std 802.2 (1989)

    Google Scholar 

  6. Apfelbaum, L.: Automated functional test generation. In: Proc. IEEE Autotestcon Conference (1995)

    Google Scholar 

  7. Chan, W.Y.L., Vuong, S.T., Ito, M.R.: An improved protocol test generation procedure based on UIOs. In: Proc. SIGCOM, pp. 283–294 (1989)

    Google Scholar 

  8. Chanson, S.T., Zhu, J.: A unified approach to protocol test sequence generation. In: Proc. INFOCOM, pp. 106–114 (1993)

    Google Scholar 

  9. Chen, M.-S., Choi, Y., Kershenbaum, A.: Approaches utilizing segment overlap to minimize test sequences. In: Logrippo, L., Probert, R.L., Ural, H. (eds.) Proc. IFIP WG6.1 10th Intl. Symp. on Protocol Specification, Testing, and Verification, pp. 85–98. North-Holland, Amsterdam (1990)

    Google Scholar 

  10. Chow, T.S.: Testing software design modeled by finite-state machines. IEEE Trans. on Software Engineering SE-4(3), 178–187 (1978)

    Article  Google Scholar 

  11. Edmonds, J., Johnson, E.L.: Matching, Euler tours and the Chinese postman. Mathematical Programming 5, 88–124 (1973)

    Article  MATH  MathSciNet  Google Scholar 

  12. Friedman, A.D., Menon, P.R.: Fault Detection in Digital Circuits. Prentice-Hall, Englewood Cliffs (1971)

    Google Scholar 

  13. Hennie, F.C.: Fault detecting experiments for sequential circuits. In: Proc. 5th Ann. Symp. Switching Circuit Theory and Logical Design, pp. 95–110 (1964)

    Google Scholar 

  14. Holzmann, G.J.: Design and Validation of Computer Protocols. Prentice-Hall, Englewood Cliffs (1991)

    Google Scholar 

  15. Knightson, K.G.: OSI Protocol Conformance Testing. McGraw Hill, New York (1993)

    Google Scholar 

  16. Kohavi, Z.: Switching and Finite Automata Theory, 2nd edn. McGraw-Hill, New York (1978)

    MATH  Google Scholar 

  17. Kurshan, R.P.: Computer-aided Verification of Coordinating Processes. Princeton University Press, Princeton (1995)

    MATH  Google Scholar 

  18. Lee, D., Sabnani, K.K., Kristol, D.M., Paul, S.: Conformance testing of protocols specified as communicating finite state machines - a guided random walk based approach. IEEE Trans. on Communications 44(5), 631–640 (1996)

    Article  Google Scholar 

  19. Lee, D., Yannakakis, M.: On-line minimization of transition systems. In: Proc. 24th Ann. ACM Symp. on Theory of Computing, pp. 264–274 (1992)

    Google Scholar 

  20. Lee, D., Yannakakis, M.: Testing finite state machines: state identification and verification. IEEE Trans. on Computers 43(3), 306–320 (1994)

    Article  MathSciNet  Google Scholar 

  21. Lee, D., Yannakakis, M.: Principles and Methods of Testing Finite State Machines - a Survey. Proceedings of IEEE 84(8), 1089–1123 (1996)

    Article  Google Scholar 

  22. Lee, D., Yannakakis, M.: Optimization Problems from Feature Testing of Communication Protocols. In: Proc. of Intl. Conf. on Network Protocols, pp. 66–75 (1996)

    Google Scholar 

  23. Lee, D., Yannakakis, M.: in preparation

    Google Scholar 

  24. Lee, D., Yannakakis, M.: Pithia - An automatic test generation software tool for communication systems (in preparation)

    Google Scholar 

  25. Miller, R.E., Paul, S.: On the generation of minimal length test sequences for conformance testing of communication protocols. IEEE/ACM Trans. on Networking 1(1), 116–129 (1993)

    Article  Google Scholar 

  26. Moore, E.F.: Gedanken-experiments on sequential machines. In: Automata Studies, Annals of Mathematics Studies, vol. 34, pp. 129–153. Princeton University Press, Princeton (1956)

    Google Scholar 

  27. Naito, S., Tsunoyama, M.: Fault detection for sequential machines by transitions tours. In: Proc. IEEE Fault Tolerant Comput. Symp., pp. 238–243. IEEE Computer Society Press, Los Alamitos (1981)

    Google Scholar 

  28. Rivest, R.L., Schapire, R.E.: Inference of finite automata using homing sequences. In: Proc. 21st Ann. Symp. on Theory of Computing, pp. 411–420 (1989)

    Google Scholar 

  29. Sabnani, K.K., Dahbura, A.T.: A protocol test generation procedure. Computer Networks and ISDN Systems 15(4), 285–297 (1988)

    Article  Google Scholar 

  30. Sarikaya, B., Bochmann, G.v.: Synchronization and specification issues in protocol testing. IEEE Trans. on Commun. COM-32(4), 389–395 (1984)

    Article  Google Scholar 

  31. Sidhu, D.P., Leung, T.-K.: Formal methods for protocol testing: a detailed study. IEEE Trans. Soft. Eng. 15(4), 413–426 (1989)

    Article  Google Scholar 

  32. Sokolovskii, M.N.: Diagnostic experiments with automata. Kibernetika 6, 44–49 (1971)

    MathSciNet  Google Scholar 

  33. Uyar, M.U., Dahbura, A.T.: Optimal test sequence generation for protocols: the Chinese postman algorithm applied to Q.931. In: Proc. IEEE Global Telecommunications Conference (1986)

    Google Scholar 

  34. Vasilevskii, M.P.: Failure diagnosis of automata. Kibernetika 4, 98–108 (1973)

    MathSciNet  Google Scholar 

  35. Yang, B., Ural, H.: Protocol conformance test generation using multiple UIO sequences with overlapping. In: Proc. SIGCOM, pp. 118–125 (1990)

    Google Scholar 

  36. Yannakakis, M., Lee, D.: Testing finite state machines: fault detection. J. of Computer and System Sciences 50(2), 209–227 (1995)

    Article  MATH  MathSciNet  Google Scholar 

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© 1999 Springer-Verlag Berlin Heidelberg

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Yannakakis, M., Lee, D. (1999). Testing of Finite State Systems. In: Gottlob, G., Grandjean, E., Seyr, K. (eds) Computer Science Logic. CSL 1998. Lecture Notes in Computer Science, vol 1584. Springer, Berlin, Heidelberg. https://doi.org/10.1007/10703163_3

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  • DOI: https://doi.org/10.1007/10703163_3

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-65922-8

  • Online ISBN: 978-3-540-48855-2

  • eBook Packages: Springer Book Archive

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