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Similarity Measurement for Off-Line Signature Verification

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Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 3644))

Abstract

Existing methods to deal with off-line signature verification usually adopt the feature representation based approaches which suffer from limited training samples. It is desired to employ straightforward means to measure similarity between 2-D static signature graphs. In this paper, we incorporate merits of both global and local alignment methods. Two signature patterns are globally registered using weak affine transformation and correspondences of feature points between two signature patterns are determined by applying an elastic local alignment algorithm. Similarity is measured as the mean square of sum Euclidean distances of all found corresponding feature points based on a match list. Experimental results showed that the computed similarity measurement was able to provide sufficient discriminatory information. Verification performance in terms of equal error rate was 18.6% with four training samples.

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© 2005 Springer-Verlag Berlin Heidelberg

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You, X., Fang, B., He, Z., Tang, Y. (2005). Similarity Measurement for Off-Line Signature Verification. In: Huang, DS., Zhang, XP., Huang, GB. (eds) Advances in Intelligent Computing. ICIC 2005. Lecture Notes in Computer Science, vol 3644. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11538059_29

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  • DOI: https://doi.org/10.1007/11538059_29

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-28226-6

  • Online ISBN: 978-3-540-31902-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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