Abstract
n-way combinatorial testing is a specification-based testing criterion, which requires that for a system consisting of a few parameters, every combination of valid values of arbitrary n (n ≥ 2) parameters be covered by at least one test. In this paper, we propose two different tests generation algorithms based on the combinatorial design for the n-way combination testing. We show that the produced tests can cover all the combinations of parameters to the greatest degree with the small quantity. We implemented the automatic test generators based on the algorithms and obtained some valuable empirical results.
This work was supported in part by the National Natural Science Foundation of China (60425206, 60373066, 60403016), National Grand Fundamental Research 973 Program of China (2002CB312000) and the Natural Science Foundation of Jiangsu Province(BK2005060). Correspondence to: Baowen Xu, Department of Computer Science and Engineering, Southeast Univsity, 210096 Nanjing, China. Email: bwxu@seu.edu.cn
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© 2005 Springer-Verlag Berlin Heidelberg
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Nie, C., Xu, B., Shi, L., Dong, G. (2005). Automatic Test Generation for N-Way Combinatorial Testing . In: Reussner, R., Mayer, J., Stafford, J.A., Overhage, S., Becker, S., Schroeder, P.J. (eds) Quality of Software Architectures and Software Quality. QoSA SOQUA 2005 2005. Lecture Notes in Computer Science, vol 3712. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11558569_15
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DOI: https://doi.org/10.1007/11558569_15
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-29033-9
Online ISBN: 978-3-540-32056-2
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