Skip to main content

Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs

  • Conference paper
Computer Vision – ACCV 2006 (ACCV 2006)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 3852))

Included in the following conference series:

Abstract

In this paper, we address one very important industrial application of computer vision – automatic classification of materials. In our work, we have considered materials that are mixtures of two or more elements. Such materials are called alloys. It is observed at the microscopic level that an alloy is composed of small randomly distributed crystals of varying shapes and sizes called grains. Also, the color and hence the intensity of the grains vary in alloys. Generally, this shape-size-intensity distribution of the grains is different for different materials. This means micrographs obtained from different materials form texture-like images that differ from one material to another in appearance. Therefore, in principle, any texture analysis method may be used for material classification. In our method, we propose to extract textural features corresponding to grain geometry and intensity and use them for analysis and classification of alloys. These features are extracted via gray-scale morphological operations and are measured in terms of Size-Intensity-Diagram (SID) and Tri-variate Pattern Spectrum (TPS) coefficients. In our experiments, we achieved 83.43% and 89.43% classification accuracies in cases of SID and TPS, respectively. This demonstrates the effectiveness of the proposed method for material classification which in turn confirms that our choice of features is indeed appropriate for the purpose.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Dana, K., van Ginneken, B., Nayar, S., Koenderink, J.: Reflectance and texture of real world surfaces. ACM Trans. Graphics 18, 1–34 (1999)

    Article  Google Scholar 

  2. Chantler, M., McGunnigle, G., Wu, J.: Surface rotation invariant texture classification using photometric stereo and surface magnitude spectra. In: Proc. 11th British Machine Vision Conf., Bristol, UK, pp. 486–495 (2000)

    Google Scholar 

  3. Leung, T., Malik, J.: Representing and recognizing the visual appearance of materials using three dimensional textons. Intl. J. Computer Vision 43, 29–44 (2001)

    Article  MATH  Google Scholar 

  4. Varma, M., Zisserman, A.: Classifying images of materials: Achieving viewpoint and illumination independence. In: Proc. 7th European Conf. Computer Vision, Denmark, vol. 3, pp. 255–271 (2002)

    Google Scholar 

  5. Varma, M., Zisserman, A.: Statistical approaches to material classification. In: Proc. 3rd Indian Conf. Computer Vision, Graphics and Image Processing, Ahmedabad, India, pp. 167–172 (2002)

    Google Scholar 

  6. Meloy, T.: Shape characterization of particles – problems and progress. In: Advanced Materials – Application of Mineral and Metallurgical Processing Principles, pp. 195–203. Society of Mining Engineers of AIME, USA (1990)

    Google Scholar 

  7. Nicoletti, D., Bilgutay, N., Onaral, B.: Power-law relationships between the dependence of ultrasonic attenuation on wavelength and the grain size distribution. J. Acoustical Society of America 91, 3278–3284 (1992)

    Article  Google Scholar 

  8. Wang, W., Bergholm, F.: On moment-based edge density for automatic size inspection. In: Proc. 9th Scandinavian Conf. Image Analysis, Sweden, vol. 2, pp. 895–904 (1995)

    Google Scholar 

  9. Serra, J.: Image Analysis and Mathematical Morphology. Academic Press, London (1982)

    MATH  Google Scholar 

  10. Huet, F., Mattioli, J.: A textural analysis by mathematical morphology transformations: Structural opening and top-hat. In: Proc. Intl. Conf. Image Processing, Switzerland, vol. 3, pp. 49–52 (1996)

    Google Scholar 

  11. Li, W., Hease-Coat, V., Ronsin, J.: Robust morphological features for texture classification. In: Proc. Intl. Conf. Image Processing, Switzerland, vol. 3, pp. 173–176 (1996)

    Google Scholar 

  12. Asano, A.: Texture analysis using morphological pattern spectrum and optimization of structuring element. In: Proc. 10th Intl. Conf. Image Analysis and Processing, Italy, pp. 209–214 (1999)

    Google Scholar 

  13. Singh, S., Kumar, V., Ghosh, D.: Binary texture analysis and classification using bi-variate morphological pattern spectrum. In: Proc. Intl. Conf. Imaging Science, Systems and Technology, Las Vegas, vol. 2, pp. 790–795 (2001)

    Google Scholar 

  14. Rautio, H., Silven, O.: Average grain size determination using mathematical morphology and texture analysis. In: Proc. 6th IAPR Workshop on Machine Vision Applications, Japan, pp. 506–509 (1998)

    Google Scholar 

  15. Maragos, P.: Pattern spectrum and multiscale shape representation. IEEE Trans. Pattern Analysis & Machine Intelligence 11, 701–715 (1989)

    Article  MATH  Google Scholar 

  16. Trettel, E., Lotufo, R.: The size-intensity diagram: A gray-scale granulometric analysis tool. In: Proc. 9th Brazilian Symp. Computer Graphics and Image Processing, Caxambu, Brazil, pp. 259–264 (1996)

    Google Scholar 

  17. Ghosh, P., Chanda, B.: Bi-variate pattern spectrum. In: Proc. 11th Brazilian Symp. Computer Graphics and Image Processing, Rio de Janeiro, Brazil, pp. 476–483 (1998)

    Google Scholar 

  18. Athreya, G., Ghosh, D.: Trivariate pattern spectrum: A shape-size descriptor for gray scale images. In: Proc. 8th Natl. Conf. Communications, Mumbai, India, pp. 40–44 (2002)

    Google Scholar 

  19. Giardina, C., Dougherty, E.: Morphological Methods in Image and Signal Processing. Prentice-Hall, Englewood Cliffs (1998)

    Google Scholar 

  20. Sternberg, S.: Grayscale morphology. Computer Vision, Graphics and Image Processing 35, 333–355 (1986)

    Article  Google Scholar 

  21. Asano, A., Miyagawa, M., Fujio, M.: Texture modelling by optimal gray scale structuring element using morphological pattern spectrum. In: Proc. 15th Intl. Conf. Pattern Recognition, Spain, vol. 3, pp. 475–478 (2000)

    Google Scholar 

  22. Athreya, G., Ghosh, D., Chakrabarti, I.: Texture classification using morphological trivariate pattern spectrum for texture description. In: Proc. Intl. Conf. Imaging Science, Systems and Technology, Las Vegas, vol. 2, pp. 830–836 (2002)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2006 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Ghosh, D., Wei, D.C.T. (2006). Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs. In: Narayanan, P.J., Nayar, S.K., Shum, HY. (eds) Computer Vision – ACCV 2006. ACCV 2006. Lecture Notes in Computer Science, vol 3852. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11612704_62

Download citation

  • DOI: https://doi.org/10.1007/11612704_62

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-31244-4

  • Online ISBN: 978-3-540-32432-4

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics