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Accurate Extraction of Reciprocal Space Information from Transmission Electron Microscopy Images

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Advances in Visual Computing (ISVC 2006)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 4291))

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Abstract

As the study of complex systems has become dominant in physics the link between computational and physical science has become ever more important. In particular, with the rising popularity of imaging techniques in physis, the development and application of cutting edge computer vision techniques has become vital. Here we present novel image analysis methods which can be used to extract the position of features in diffraction patterns (reciprocal space) with unprecedented accuracy.

The first contribution we have developed is a method for calculating the nonlinear response of photographic film by using the noise in the image enabling the extraction of accurate intensity information. This allows high-resolution (but non-linear) film to be used in place of low-resolution (but linear) CCD cameras. The second contribution is a method for accurately localising very faint features in diffraction patterns by modelling the features and using the expectation maximization algorithm directly on the image to fit them. The accuracy of this technique has been verified by testing it on synthetic data.

These methods have been applied to transmission electron microscopy data, and have already enabled discoveries which would have been impossible using previously available techniques.

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Author information

Authors and Affiliations

  1. Los Alamos National Laboratory, Los Alamos, NM, USA

    Edward Rosten & Susan Cox

Authors
  1. Edward Rosten
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  2. Susan Cox
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Editor information

Editors and Affiliations

  1. Department of Computer Science and Engineering, University of Nevada, Reno, USA

    George Bebis

  2. NASA Ames Research Center, Moffett Field, CA, USA

    Richard Boyle

  3. Lawrence Berkeley National Laboratory, Berkeley, CA, USA

    Bahram Parvin

  4. Desert Research Institute, Reno, NV, USA

    Darko Koracin

  5. Digital Image Research Center, Kingston University, London, UK

    Paolo Remagnino

  6. Intel, 95052, Santa Clara, CA, USA

    Ara Nefian

  7. University of California, 430, Computer Science Building, 92697-3425, Irvine, CA, USA

    Gopi Meenakshisundaram

  8. Institute for Data Analysis and Visualization, P.O. Box

    Valerio Pascucci

  9. Department of Computer Science and Engineering, Czech Technical University in Prague, Czech

    Jiri Zara

  10. Rockwell Scientific, 1049 Camino Dos Rios, 91360, Thousand Oaks, CA, USA

    Jose Molineros

  11. Computer Graphics Group, Bielefeld University, D-33501, Bielefeld, Germany

    Holger Theisel

  12. Hewlett Packard Labs, Palo Alto, CA, USA

    Tom Malzbender

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© 2006 Springer-Verlag Berlin Heidelberg

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Rosten, E., Cox, S. (2006). Accurate Extraction of Reciprocal Space Information from Transmission Electron Microscopy Images. In: Bebis, G., et al. Advances in Visual Computing. ISVC 2006. Lecture Notes in Computer Science, vol 4291. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11919476_38

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  • DOI: https://doi.org/10.1007/11919476_38

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-48628-2

  • Online ISBN: 978-3-540-48631-2

  • eBook Packages: Computer ScienceComputer Science (R0)

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