Skip to main content

LEIRIOS Test Generator: Automated Test Generation from B Models

  • Conference paper
B 2007: Formal Specification and Development in B (B 2007)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 4355))

Included in the following conference series:

Abstract

Since 2003, automated test generation from B abstract machines has been trying out in the smart card industry, using LEIRIOS Test Generator (LTG) for SmartCard tool. Now the major card manufacturers, such as Gemalto and Giesecke & Devrient, are regularly deploying model-based testing in their validation processes. The purpose is black-box functional testing: from the specifications (a standard or specific requirements), a B formal model is developed which is the basis for test generation. Generated test cases are then translated into executable test scripts and then run on the application.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Legeard, B., Peureux, F., Utting, M.: Automated boundary testing from Z and B. In: Eriksson, L.-H., Lindsay, P.A. (eds.) FME 2002. LNCS, vol. 2391, pp. 21–40. Springer, Heidelberg (2002)

    Chapter  Google Scholar 

  2. Ambert, F., Bouquet, F., Chemin, S., Guenaud, S., Legeard, B., Peureux, F., Vacelet, N., Utting, M.: BZ-TT: A tool-set for test generation from Z and B using constraint logic programming. In: Proc. of Formal Approaches to Testing of Software, FATES 2002 (workshop of CONCUR 2002), Brnö, République Tchèque, August 2002, pp. 105–120 (2002)

    Google Scholar 

  3. Bernard, E., Legeard, B., Luck, X., Peureux, F.: Generation of test sequences from formal specifications: GSM 11-11 standard case study. International Journal of Software Practice and Experience 34(10), 915–948 (2004)

    Article  Google Scholar 

  4. Legeard, B., Peureux, F., Utting, M.: Controlling test case explosion in test generation from B formal models. Software Testing, Verification and Reliability, STVR 14(2), 81–103 (2004)

    Article  Google Scholar 

  5. Bouquet, F., Legeard, B.: Reification of executable test scripts in formal specification-based test generation: The java card transaction mechanism case study. In: Araki, K., Gnesi, S., Mandrioli, D. (eds.) FME 2003. LNCS, vol. 2805, pp. 778–795. Springer, Heidelberg (2003)

    Chapter  Google Scholar 

  6. Schneider, S.: The B-Method - An Introduction, p. 370 (2001) ISBN 0-333-79284-X

    Google Scholar 

  7. Utting, M., Legeard, B.: Practical Model-Based Testing - A Tools Approach, p. 528 (2006) ISBN 0-12-372501-1

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2006 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Jaffuel, E., Legeard, B. (2006). LEIRIOS Test Generator: Automated Test Generation from B Models. In: Julliand, J., Kouchnarenko, O. (eds) B 2007: Formal Specification and Development in B. B 2007. Lecture Notes in Computer Science, vol 4355. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11955757_29

Download citation

  • DOI: https://doi.org/10.1007/11955757_29

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-68760-3

  • Online ISBN: 978-3-540-68761-0

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics