Abstract
We propose a new very simple method to determine roughness of a surface of an implant material from its scanning electron microscopy (SEM) image. For this purpose we have combined a preprocessing method that has been used in histopathology with fractal method used in nonlinear time series analysis. In the pre-processing step the image is transformed into 1-D signals (‘landscapes’) that are subsequently analyzed. Our method draws from multiple disciplines and may find multidisciplinary applications.
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© 2005 Springer-Verlag Berlin Heidelberg
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Klonowski, W., Olejarczyk, E., Stepien, R. (2005). SEM Image Analysis for Roughness Assessment of Implant Materials. In: Kurzyński, M., Puchała, E., Woźniak, M., żołnierek, A. (eds) Computer Recognition Systems. Advances in Soft Computing, vol 30. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-32390-2_65
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DOI: https://doi.org/10.1007/3-540-32390-2_65
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-25054-8
Online ISBN: 978-3-540-32390-7
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