Abstract
A comparison is made of global and local methods for the shape analysis of logos in an image database. The qualities of the methods are judged by using the shape signatures to define a similarity metric on the logos. As representatives for the two classes of methods, we use the negative shape method which is based on local shape information and a wavelet-based method which makes use of global information. We apply both methods to images with different kinds of degradations and examine how a given degradation highlights the strengths and shortcomings of each method. Finally, we use these results to combine information from both methods and develop a new method which is based on the relative performances of the two methods.
The support of the National Science Foundation under Grants CDA-95-03994, IRI-97-12715, EIA-99-00268, and IIS-00-86162 is gratefully acknowledged.
Currently at IBM Research Lab, Haifa 31905, Israel.
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© 2001 Springer-Verlag Berlin Heidelberg
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Neumann, J., Samet, H., Soffer, A. (2001). Integration of Local and Global Shape Analysis for Logo Classification. In: Arcelli, C., Cordella, L.P., di Baja, G.S. (eds) Visual Form 2001. IWVF 2001. Lecture Notes in Computer Science, vol 2059. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45129-3_71
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DOI: https://doi.org/10.1007/3-540-45129-3_71
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