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Joint Pattern Recognition Symposium

DAGM 2001: Pattern Recognition pp 155–162Cite as

Affine Point Pattern Matching

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Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 2191))

Abstract

This paper presents a general solution for the problem of affine point pattern matching (APPM). Formally, given two sets of two-dimensional points (x,y) which are related by a general affine transformation (up to small deviations of the point coordinates and maybe some additional outliers). Then we can determine the six parameters aik of the transformation using new Hu point-invariants which are invariant with respect to affine transformations. With these invariants we compute a weighted point reference list. The affine parameters can be calculated using the method of the least absolute differences (LAD method) and using linear programming. In comparison to the least squares method, our approach is very robust against noise and outliers. The algorithm works in O(n) average time and can be used for translation and/or rotations, isotropic and non-isotropic scalings, shear transformations and reflections.

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References

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Author information

Authors and Affiliations

  1. Department of Computer Science, Friedrich-Schiller-University Jena, Ernst-Abbe-Platz 1-4, D-07743, Jena, Germany

    K. Voss & H. Suesse

Authors
  1. K. Voss
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  2. H. Suesse
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Editor information

Editors and Affiliations

  1. Chair of Image Understanding and Knowledge Based Systems, Technical University Munich, Orleansstr. 34, 81667, Munich, Germany

    Bernd Radig  & Stefan Florczyk  & 

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© 2001 Springer-Verlag Berlin Heidelberg

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Voss, K., Suesse, H. (2001). Affine Point Pattern Matching. In: Radig, B., Florczyk, S. (eds) Pattern Recognition. DAGM 2001. Lecture Notes in Computer Science, vol 2191. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45404-7_21

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  • DOI: https://doi.org/10.1007/3-540-45404-7_21

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-42596-0

  • Online ISBN: 978-3-540-45404-5

  • eBook Packages: Springer Book Archive

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