Abstract
Commercial-Off-The-Shelf SRAM-based FPGA devices are becoming of interests for applications where high dependability and low cost are mandatory constraints. This paper proposes a new fault injection environment, which offers an alternative to radiation testing for evaluating the effects of charged particles on the configuration memory of SRAM-based FPGA devices. This paper describes the fault injection environment and reports preliminary results gathered on some benchmark circuits.
This work has been partially supported by Center of Excellence on Multimedia Radio communications (CERCOM) of Politecnico di Torino and by Agenzia Spaziale Italiana.
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Rebaudengo, M., Reorda, M.S., Violante, M. (2002). Simulation-Based Analysis of SEU Effects on SRAM-based FPGAs. In: Glesner, M., Zipf, P., Renovell, M. (eds) Field-Programmable Logic and Applications: Reconfigurable Computing Is Going Mainstream. FPL 2002. Lecture Notes in Computer Science, vol 2438. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-46117-5_63
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DOI: https://doi.org/10.1007/3-540-46117-5_63
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