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Some Implications of MSC, SDL and TTCN Time Extensions for Computer-Aided Test Generation

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SDL 2001: Meeting UML (SDL 2001)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 2078))

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Abstract

The purpose of this paper is to describe how computer-aided test generation methods can benefit from the time features and extensions to MSC, SDL and TTCN which are either already available or currently under study in the EC Interval project. The implications for currently available test generation tools are shown and proposals for their improvement are made. The transformation of MSC-2000 time concepts into TTCN-3 code is described in detail.

Part of this work has been sponsored by the European Commission under contract IST-1999-11557.

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Author information

Authors and Affiliations

  1. Institute for Telematics, University of Lübeck, Ratzeburger Allee 160, D-23538, Lübeck, Germany

    Dieter Hogrefe, Beat Koch & Helmut Neukirchen

Authors
  1. Dieter Hogrefe
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  2. Beat Koch
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  3. Helmut Neukirchen
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Editor information

Editors and Affiliations

  1. Telecommunications Software Engineering Ltd., 13Weston House, 18-22 Church Street, Lutterworth, Leicestershire, LE17 4AW, UK

    Rick Reed  & Jeanne Reed  & 

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© 2001 Springer-Verlag Berlin Heidelberg

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Hogrefe, D., Koch, B., Neukirchen, H. (2001). Some Implications of MSC, SDL and TTCN Time Extensions for Computer-Aided Test Generation. In: Reed, R., Reed, J. (eds) SDL 2001: Meeting UML. SDL 2001. Lecture Notes in Computer Science, vol 2078. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-48213-X_11

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  • DOI: https://doi.org/10.1007/3-540-48213-X_11

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  • Print ISBN: 978-3-540-42281-5

  • Online ISBN: 978-3-540-48213-0

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