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Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms

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Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 1667))

Abstract

The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric versions. This approach allows to skip the signature prediction phase inherent to conventional transparent memory testing and therefore to significantly reduce test time. The hardware overhead and fault coverage of the new BIST scheme are comparable to the conventional transparent BIST structures. Experimental results show that in many cases the proposed test techniques achieve a higher fault coverage in shorter test time.

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© 1999 Springer-Verlag Berlin Heidelberg

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Yarmolik, V.N., Bykov, I.V., Hellebrand, S., Wunderlich, HJ. (1999). Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms. In: Hlavička, J., Maehle, E., Pataricza, A. (eds) Dependable Computing — EDCC-3. EDCC 1999. Lecture Notes in Computer Science, vol 1667. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-48254-7_23

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  • DOI: https://doi.org/10.1007/3-540-48254-7_23

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-66483-3

  • Online ISBN: 978-3-540-48254-3

  • eBook Packages: Springer Book Archive

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