Abstract
Event-triggered distributed real-time systems are prohibitively difficult to test due the required test effort. The test effort includes instrumenting the test object, and generating, executing, and analyzing the test results. The test effort can be significantly reduced by the use of an distributed active real-time database, thanks to the transaction concept and the built-in event monitor. The two major problems identified w.r.t. testing are the following. Firstly, whether the test effort is manageable. Secondly, whether the introduced run-time overhead is acceptable, i.e., no critical deadlines are missed due to testing.
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This work was supported by NUTEK(The Swedish National Board for Industrial and Technical Development), as part of the Distributed Reconfigurable Real-Time Database Systems Project in the Embedded Systems Program.
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Mellin, J. (1998). Supporting System-Level Testing of Applications by Active Real-Time Database Systems. In: Andler, S.F., Hansson, J. (eds) Active, Real-Time, and Temporal Database Systems. ARTDB 1997. Lecture Notes in Computer Science, vol 1553. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-49151-1_11
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