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Fast incremental planarity testing

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Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 623))

Abstract

The incremental planarity testing problem is to perform the following operations on a biconnected planar graph G of at most n vertices: test if an edge can be added between two vertices while preserving planarity; add edges and vertices that preserve planarity. Let m be the total number of operations. We present fast data structures for this problem that can be used in conjunction with the previous algorithm of Di Battista and Tamassia to achieve an O(α(m, n)) worst-case amortized time per test operation. If the graph is biconnected, a sequence of n additions can be performed in total time O(mα(m, n)) worst-case plus O(n) expected time. Our tree data structure is flexible and can answer in O(1) time queries about parents, roots, and nearest common ancestors while performing tree modifications such as inserting nodes, cutting edges, and merging or splitting nodes. If the graph is not biconnected then insertions of edges and vertices require O(log n) amortized expected time per operation.

Research partially supported by National Science Foundation Grant CCR-9008653.

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W. Kuich

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© 1992 Springer-Verlag Berlin Heidelberg

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Westbrook, J. (1992). Fast incremental planarity testing. In: Kuich, W. (eds) Automata, Languages and Programming. ICALP 1992. Lecture Notes in Computer Science, vol 623. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-55719-9_86

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  • DOI: https://doi.org/10.1007/3-540-55719-9_86

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-55719-7

  • Online ISBN: 978-3-540-47278-0

  • eBook Packages: Springer Book Archive

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