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International Conference on Vector and Parallel Processing

International Conference on Parallel Processing

VAPP 1992, CONPAR 1992: Parallel Processing: CONPAR 92—VAPP V pp 527–538Cite as

On tests of uniform tree circuits

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Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 634))

Abstract

This paper explores the structure of test complexity classes of uniform tree circuits. We prove that the test complexity of a balanced uniform tree circuit is either O(1) or Ω(lg n), the test complexity of balanced uniform tree circuits based on commutative functions can be divided into constant, logarithmic and polynomial classes, and balanced uniform tree circuits based on monotonic functions are all Θ(n r) (r ∈ (0,1]) testable.

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References

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Authors and Affiliations

  1. FB14-Informatik, Universität des Saarlandes, W-6600, Saarbrücken, Germany

    Hongzhong Wu

Authors
  1. Hongzhong Wu
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Editor information

Luc Bougé Michel Cosnard Yves Robert Denis Trystram

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© 1992 Springer-Verlag Berlin Heidelberg

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Wu, H. (1992). On tests of uniform tree circuits. In: Bougé, L., Cosnard, M., Robert, Y., Trystram, D. (eds) Parallel Processing: CONPAR 92—VAPP V. VAPP CONPAR 1992 1992. Lecture Notes in Computer Science, vol 634. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-55895-0_451

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  • DOI: https://doi.org/10.1007/3-540-55895-0_451

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-55895-8

  • Online ISBN: 978-3-540-47306-0

  • eBook Packages: Springer Book Archive

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