Abstract
This paper presents a new parallel thinning algorithm. Thinning algorithms based on contour tracing are strongly sequential and irregular, with a complexity of O(n 2). Thinning algorithms using parallel neighboring operations are regular with a complexity of O(n 3).
The parallel thinning approach we propose uses the notion of multi-scaling. This new algorithm keeps the regularity and parallelism of the neighboring operator while achieving a cost of O(n 2). Complexity analysis and comparison with a well-known thinning algorithm using a SIMD machine are presented.
This work was supported by EEC ESPRIT Basic Research Action 3280 “NANA” and the CNRS Coordinated Research Program C 3.
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© 1992 Springer-Verlag Berlin Heidelberg
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Levaire, JL., Ubeda, S. (1992). A multiscale parallel thinning algorithm. In: Bougé, L., Cosnard, M., Robert, Y., Trystram, D. (eds) Parallel Processing: CONPAR 92—VAPP V. VAPP CONPAR 1992 1992. Lecture Notes in Computer Science, vol 634. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-55895-0_460
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DOI: https://doi.org/10.1007/3-540-55895-0_460
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