Abstract
The development of CTMCs to model RAIDs with a general failure-repair process seems a complex task. The introduction of a technique with higher modeling level, that facilitates the description of the failure-repair processes is essential to deepen in the dependability analysis of these systems.
In this paper, different dependability models of RAID level 5 are presented. The chosen technique is an extension of timed Petri nets known as Stochastic Activity Networks (SAN). As will be shown, it is relatively simple to describe a SAN equivalent to the developed CTMC. This model will be called the basic model. Furthermore, the flexibility introduced by these nets, through the cases associated with its timed activities and the input and output gates, allows an extension of the basic SAN model in order to obtain more accurate results or to adapt it to a new specification of the system operation. Thus, the basic model will be modified to represent the repair process with detail, differentiating its two phases: replacement and reconstruction. Also, the influence of a limited number of on-line spares on the reliability of the system will be considered. Thereinafter, using the structure of the basic model, a SAN of a RAID with a higher protection level (RAID level 6) is presented.
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Santonja, V., Alonso, M., Molero, J., Serrano, J.J., Gil, P., Ors, R. (1996). Dependability models of RAID using stochastic activity networks. In: Hlawiczka, A., Silva, J.G., Simoncini, L. (eds) Dependable Computing — EDCC-2. EDCC 1996. Lecture Notes in Computer Science, vol 1150. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-61772-8_35
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DOI: https://doi.org/10.1007/3-540-61772-8_35
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