Abstract
The project we are working on is to help develop and test a low cost, large area, high resolution X-ray detection system with a high dynamic range. The large area is achieved by butting two or more scintillator/fiber/CCD combinations together. An algorithm is thus required to compensate the defects come from the detector induced errors including missing single pixel due to individual defective detectors or missing column(s)/row(s) due to misalignment of adjacent CCD's in the blurred and noise corrupted images. Mean field annealing, as a global optimization technique, is the proposed algorithm. This paper, however, proposes a new approach based on multiresolution analysis where the defect compensation is implemented by removing the characteristics created by the missing columns/rows from the detail images of lower resolution. Experiments will be carried out to compare the performance of these two approaches. Future research directions are discussed at last.
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© 1997 Springer-Verlag Berlin Heidelberg
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Qi, H., Snyder, W.E., Bilbro, G.L. (1997). Comparison of mean field annealing and multiresolution analysis in missing data estimation. In: Chin, R., Pong, TC. (eds) Computer Vision — ACCV'98. ACCV 1998. Lecture Notes in Computer Science, vol 1351. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-63930-6_187
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DOI: https://doi.org/10.1007/3-540-63930-6_187
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