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Digital Fingerprinting pp 31–38Cite as

Device Measurement and Origin of Variation

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Abstract

In this chapter a methodology is set forth that allows one to determine whether or not a particular device component causes, or contributes significantly to, the differences in signalling behaviour between devices that allow for their identification.

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References

  1. Kumar, S., Suresh, K.K.S.: Electric Circuits and Networks. Pearson Education (2009)

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  2. Weber, R.J.: Introduction to Microwave Circuits: Radio Frequency and Design Applications. IEEE Press (2001)

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Author information

Authors and Affiliations

  1. Utah State University, Logan, Utah, 84322, USA

    Ryan M. Gerdes

  2. Iowa State University, Ames, Iowa, 50011, USA

    Mani Mina & Thomas E. Daniels

Authors
  1. Ryan M. Gerdes
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  2. Mani Mina
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  3. Thomas E. Daniels
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Corresponding author

Correspondence to Ryan M. Gerdes .

Editor information

Editors and Affiliations

  1. Computing and Information Science Division, Army Research Office, Durham, North Carolina, USA

    Cliff Wang

  2. Department of Electrical and Computer Engineering, Virginia Polytechnic Institute, Arlington, Virginia, USA

    Ryan M. Gerdes

  3. Department of Electrical and Computer Engineering, Iowa State University, Ames, Iowa, USA

    Yong Guan

  4. Computer Science Department, University of Utah, Salt Lake City, Utah, USA

    Sneha Kumar Kasera

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© 2016 Springer Science+Business Media New York

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Gerdes, R.M., Mina, M., Daniels, T.E. (2016). Device Measurement and Origin of Variation. In: Wang, C., Gerdes, R., Guan, Y., Kasera, S. (eds) Digital Fingerprinting. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-6601-1_3

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  • DOI: https://doi.org/10.1007/978-1-4939-6601-1_3

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  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4939-6599-1

  • Online ISBN: 978-1-4939-6601-1

  • eBook Packages: Computer ScienceComputer Science (R0)

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