Abstract
In this paper, a sampled-based version of the visual assessment of cluster tendency (VAT) algorithm [2] for large datasets is presented. The proposed algorithm consists of two main steps. We first propose a postprocessing task of the ProTraS algorithm [9] to obtain a sample of the dataset such that clusters in the sample are separated as much as possible while preserving the cluster structure of the whole dataset. The second one is to apply iVAT [5] on the sample to display the cluster tendency of the whole dataset. Algorithms are implemented. Numerical results are given and compared with siVAT to demonstrate the efficiency of our algorithm.
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Agarwal, P.K., Har-Peled, S., Varadarajan, K.R.: Geometric approximation via coresets. Comb. Comput. Geom. 52, 1–30 (2005)
Bezdek, J., Hathaway, R.: VAT: a tool for visual assessment of (cluster) tendency. In: Proceedings of International Joint Conference on Neural Networks (IJCNN), Honolulu, HI, USA, pp. 2225–2230 (2002)
Fahad, A., et al.: A survey of clustering algorithms for big data: taxonomy and empirical analysis. IEEE Trans. Emerg. Top. Comput. 2(3), 267–279 (2014)
Hathaway, R., Bezdek, J., Huband, J.: Scalable visual asseessment of cluster tendency for large data sets. Pattern Recogn. 39(7), 1315–1324 (2006)
Havens, T.C., Bezdek, J.C.: An efficient formulation of the improved visual assessment of cluster tendency (IVAT) algorithm. IEEE Trans. Knowl. Data Eng. 24(5), 813–822 (2012)
Honda, K., Sako, T., Ubukata, S., Notsu, A.: Visual assessment of co-cluster structure through co-occurrence-sensitive ordering. In: Proceedings of Joint 17th World Congress of International Fuzzy Systems Association and 9th International Conference on Soft Computing and Intelligent Systems (IFSA-SCIS), Otsu, Japan, pp. 1–6 (2017)
Huband, J.M., Bezdek, J.C., Hathaway, R.J.: bigVAT: visual assessment of cluster tendency for large data sets. Pattern Recogn. 38, 1875–1886 (2005)
Iredale, T. B., Erfani, S. M., Leckie, C.: An efficient visual assessment of cluster tendency tool for large-scale time series data sets. In: Proceedings of IEEE International Conference on Fuzzy Systems (FUZZ-IEEE), Naples, Italy (2017)
Ros, F., Guillaume, S.: ProTraS: a probabilistic traversing sampling algorithm. Expert Syst. Appl. 105, 65–76. https://doi.org/10.1016/j.eswa.2018.03.052 (2018)
Prim, R.: Shortest connection networks and some generalisations. Bell Syst. Tech. J. 36, 1389–1401 (1957)
Xu, D., Tian, Y.: A comprehensive survey of clustering algorithms. Ann. Data Sci. 2(2), 165–193 (2015)
Xu, R., Wunsch, D.: Survey of clustering algorithms. IEEE Trans. Neural Netw. 16(3), 645–678 (2005)
Wang, L., Geng, X., Bezdek, J., Leckie, C., Kotagiri, R.: SpecVAT: enhanced visual cluster analysis. In: Proceedings of the Eighth IEEE International Conference on Data Mining, Pisa, Italy, pp. 638–647 (2008)
Wang, L., Nguyen, U. T. V., Bezdek, J., Leckie, C., Ramamohanarao, K.: iVAT and aVAT: enhanced visual analysis for cluster tendency assessment. In: Proceedings of Pacific-Asia Conference on Knowledge Discovery and Data Mining (PAKDD), Hyderabad, India, pp. 16–27 (2010)
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This research is funded by Ho Chi Minh City University of Technology – VNU-HCM under grant number To-KHMT-2017-09.
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Trang, L.H., Van Ngoan, P., Van Duc, N. (2018). A Sample-Based Algorithm for Visual Assessment of Cluster Tendency (VAT) with Large Datasets. In: Dang, T., Küng, J., Wagner, R., Thoai, N., Takizawa, M. (eds) Future Data and Security Engineering. FDSE 2018. Lecture Notes in Computer Science(), vol 11251. Springer, Cham. https://doi.org/10.1007/978-3-030-03192-3_11
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