Skip to main content

A Novel Cleaning Method for Yield Data Collected by Sensors: A Case Study on Winter Cereals

  • Conference paper
  • First Online:
Computational Science and Its Applications – ICCSA 2020 (ICCSA 2020)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 12253))

Included in the following conference series:

Abstract

Winter cereals yield tracking is a common practice since decision support systems can greatly benefit from the integration of these data. However, scientific literature highlights that many systematic errors occur during yield data collection. An efficient and easy to automatize protocol to clean collected field data is still missing despite its development is essential to integrate this useful tool in a smart-farming platform.

This paper focuses on the development of a yield data cleaning procedure, easy to industrialize and performant in different contexts. This method is based on both empirical cleaning steps and statistical analysis on the “moving windows”. The developed cleaning procedure enabled the mixing of data coming from different combine harvesters and considered yield data measurements from the farmers to strengthen the results. In order to create readable and complete maps, an interpolation method concludes the procedure. The developed method is applied on a case study on real farm data.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Luque Reyes, J.R., et al.: Early prediction of winter cereals yield. In: Global IoT Summit (GIoTS). IEEE (2020)

    Google Scholar 

  2. Guidotti, D., Marchi, S., Antognelli, S., Cruciani, A.: Water management: agricolus tools integration. In: Global IoT Summit (GIoTS). IEEE (2019)

    Google Scholar 

  3. Luck, J.D., Fulton, J.D.: Best management practices for collecting accurate yield data and avoing errors during harvest. University of Nebraska Cooperative extension, Institute of Agriculture and Natural Resources (2004)

    Google Scholar 

  4. Adamchuck, V.I., Dobermann, A., Ping, J.: Listening to the story told by yield maps. University of Nebraska Cooperative extension, EC 04-704 (2004)

    Google Scholar 

  5. Sudduth, K.A., Drummond, S.T.: Yield editor: software for removing errors from crop yield maps. Agron. J. 99, 1471–1482 (2007)

    Article  Google Scholar 

  6. Arslan, S., Colvin, T.S.: Grain yield mapping: yield sensing, yield reconstruction, and errors. Precis. Agric. 3, 135–154 (2002)

    Article  Google Scholar 

  7. Kharel, T., et al.: Yield monitor data cleaning is essential for accurate corn grain/silage yield determination. Agron. J. 111, 509–516 (2018)

    Article  Google Scholar 

  8. Blackmore, S.: The interpretation of trends from multiple yield maps. Comput. Electron. Agric. 26(1), 37–51 (2000)

    Article  MathSciNet  Google Scholar 

  9. Kleinjan, J., Clay, D.E., Carlson, C.G., Clay, S.A.: Developing productivity zones from multiple years of yield monitor data. Site-Specific Management Guidelines (SSMG) Series, International Plant Nutrition Institute (IPNI) (2002)

    Google Scholar 

  10. Spekken, M., Anselmi, A.A., Molin, J.P.: A simple method for filtering spatial data. In: 9th European Conference on Precision Agriculture, ECPA (2013)

    Google Scholar 

  11. Maldaner, L., Corrêdo, L., Rodrigues Tavares, T., Mendez, L.G., Duarte, C., Molin, J.: Identifying and filtering out outliers in spatial datasets. In: 14th International Conference on Precision Agriculture, Montreal, Quebec, Canada (2018)

    Google Scholar 

  12. Vega, A., Córdoba, M., Castro-Franco, M., Balzarini, M.: Protocol for automating error removal from yield maps. Precis. Agric. 20(5), 1030–1044 (2019). https://doi.org/10.1007/s11119-018-09632-8

    Article  Google Scholar 

  13. Souza, E., Bazzi, C., Khosla, R., Uribe, O.M., Reich, R.M.: Interpolation type and data computation of crop yield maps is important for precision crop production. J. Plant Nutr. 39, 531–538 (2016)

    Article  Google Scholar 

Download references

Acknowledgements

We acknowledge Mr. Mauro Brunetti of the Foundation for Agricultural Education of Perugia for his very helpful and valuable support and collaboration in the data collection activities, and the University of Perugia to have supported the research activities as part of the PhD programme.

Funding

This research was developed within the framework of the project “RTK 2.0—Prototipizzazione di una rete RTK e di applicazioni tecnologiche innovative per l’automazione dei processi colturali e la gestione delle informazioni per l’agricoltura di precisione”—RDP 2014–2020 of Umbria—Meas. 16.1—App. 84250020256.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Sara Antognelli .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2020 Springer Nature Switzerland AG

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Natale, A., Antognelli, S., Ranieri, E., Cruciani, A., Boggia, A. (2020). A Novel Cleaning Method for Yield Data Collected by Sensors: A Case Study on Winter Cereals. In: Gervasi, O., et al. Computational Science and Its Applications – ICCSA 2020. ICCSA 2020. Lecture Notes in Computer Science(), vol 12253. Springer, Cham. https://doi.org/10.1007/978-3-030-58814-4_55

Download citation

  • DOI: https://doi.org/10.1007/978-3-030-58814-4_55

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-58813-7

  • Online ISBN: 978-3-030-58814-4

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics