Skip to main content

A Multi-level Feature Enhancement Network for Image Splicing Localization

  • Conference paper
  • First Online:

Part of the book series: Lecture Notes in Computer Science ((LNSC,volume 13180))

Abstract

Most current neural network-based splicing localization methods are based on subtle telltales from inter-pixel differences. But for recompressed and downsampled data, these artifacts are weakened. In this paper, we propose a novel multi-level feature enhancement network (MFENet) to enhance the features. Tampering with an image not only destroys the consistency of the inherent high-frequency noise in host images, but also is performed post-processing operations to weaken this discrepancy. Therefore, based on the high-pass filtered image residuals, we combine the detection evidence of post-processing operations to complete splicing forensic task. For the purpose of enhancing the distinguishability of features in the residual domain, we use bilinear pooling to fuse low-level manipulation features and residuals. In order to improve the consistency between the ground truth and the splicing localization result, we integrate global attention modules to minimize the intra-class variance by measuring the similarity of features. Finally, we propose a multi-scale training generation strategy to train our network, which provides local and global information for the input and pays more attention to the overall localization during gradient feedback. The experimental results show that our method achieves better performance than other state-of-the-art methods.

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   54.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   69.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

References

  1. NIST: Nimble media forensics challenge datasets (2016). https://www.nist.gov/itl/iad/mig/media-forensics-challenge

  2. Bappy, J.H., Roy-Chowdhury, A.K., Bunk, J., Nataraj, L., Manjunath, B.: Exploiting spatial structure for localizing manipulated image regions. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 4970–4979 (2017)

    Google Scholar 

  3. Bayar, B., Stamm, M.C.: Constrained convolutional neural networks: a new approach towards general purpose image manipulation detection. IEEE Trans. Inf. Forensics Secur. 13(11), 2691–2706 (2018)

    Article  Google Scholar 

  4. Carvalho, T., Riess, C., Angelopoulou, E., Pedrini, H., Rocha, A.: Exposing digital image forgeries by illumination color classification. IEEE Trans. Inf. Forensics Secur. 8(7), 1182–1194 (2013)

    Article  Google Scholar 

  5. Chen, M., Fridrich, J., Goljan, M., Lukas, J.: Determining image origin and integrity using sensor noise. IEEE Trans. Inf. Forensics Secur. 3(1), 74–90 (2008)

    Article  Google Scholar 

  6. Cun, X., Pun, C.-M.: Image splicing localization via semi-global network and fully connected conditional random fields. In: Leal-Taixé, L., Roth, S. (eds.) ECCV 2018. LNCS, vol. 11130, pp. 252–266. Springer, Cham (2019). https://doi.org/10.1007/978-3-030-11012-3_22

    Chapter  Google Scholar 

  7. Dirik, A.E., Memon, N.: Image tamper detection based on demosaicing artifacts. In: 2009 16th IEEE International Conference on Image Processing (ICIP), pp. 1497–1500. IEEE (2009)

    Google Scholar 

  8. Ferrara, P., Bianchi, T., De Rosa, A., Piva, A.: Image forgery localization via fine-grained analysis of CFA artifacts. IEEE Trans. Inf. Forensics Secur. 7(5), 1566–1577 (2012)

    Article  Google Scholar 

  9. Ghosh, A., Zhong, Z., E Boult, T., Singh, M.: SpliceRadar: a learned method for blind image forensics. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops, June 2019

    Google Scholar 

  10. Huh, M., Liu, A., Owens, A., Efros, A.A.: Fighting fake news: image splice detection via learned self-consistency. In: Ferrari, V., Hebert, M., Sminchisescu, C., Weiss, Y. (eds.) ECCV 2018. LNCS, vol. 11215, pp. 106–124. Springer, Cham (2018). https://doi.org/10.1007/978-3-030-01252-6_7

    Chapter  Google Scholar 

  11. Li, H., Huang, J.: Localization of deep inpainting using high-pass fully convolutional network. In: Proceedings of the IEEE/CVF International Conference on Computer Vision, pp. 8301–8310 (2019)

    Google Scholar 

  12. Li, H., Luo, W., Qiu, X., Huang, J.: Image forgery localization via integrating tampering possibility maps. IEEE Trans. Inf. Forensics Secur. 12(5), 1240–1252 (2017)

    Article  Google Scholar 

  13. Li, H., Yang, C., Lin, F., Jiang, B.: Constrained R-CNN: a general image manipulation detection model. In: IEEE ICME (2020)

    Google Scholar 

  14. Li, W., Yuan, Y., Yu, N.: Passive detection of doctored JPEG image via block artifact grid extraction. Sig. Process. 89(9), 1821–1829 (2009)

    Article  Google Scholar 

  15. Mahdian, B., Saic, S.: Using noise inconsistencies for blind image forensics. Image Vis. Comput. 27(10), 1497–1503 (2009)

    Article  Google Scholar 

  16. Ng, T.T., Hsu, J., Chang, S.F.: Columbia image splicing detection evaluation dataset (2009)

    Google Scholar 

  17. Rao, Y., Ni, J., Zhao, H.: Deep learning local descriptor for image splicing detection and localization. IEEE Access 8, 25611–25625 (2020)

    Article  Google Scholar 

  18. Salloum, R., Ren, Y., Jay Kuo, C.C.: Image splicing localization using a multi-task fully convolutional network (MFCN). J. Vis. Commun. Image Represent. 51, 201–209 (2018)

    Article  Google Scholar 

  19. Shi, Z., Shen, X., Kang, H., Lv, Y.: Image manipulation detection and localization based on the dual-domain convolutional neural networks. IEEE Access 6, 76437–76453 (2018)

    Article  Google Scholar 

  20. Singh, A., Singh, G., Singh, K.: A Markov based image forgery detection approach by analyzing CFA artifacts. Multimedia Tools Appl. 77, 28949–28968 (2018)

    Article  Google Scholar 

  21. Wu, Y., AbdAlmageed, W., Natarajan, P.: ManTra-Net: manipulation tracing network for detection and localization of image forgeries with anomalous features. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), June 2019

    Google Scholar 

  22. Ye, S., Sun, Q., Chang, E.: Detecting digital image forgeries by measuring inconsistencies of blocking artifact. In: 2007 IEEE International Conference on Multimedia and Expo, pp. 12–15. IEEE (2007)

    Google Scholar 

  23. Zhou, P., Han, X., Morariu, V., Davis, L.: Learning rich features for image manipulation detection. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), June 2018

    Google Scholar 

Download references

Acknowledgments

The authors would like to thank the anonymous reviewers for their valuable suggestions. This work was supported by National Key Technology Research and Development Program under 2020AAA0140000, 2019QY2202 and 2019QY(Y)0207.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Xianfeng Zhao .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2022 The Author(s), under exclusive license to Springer Nature Switzerland AG

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Zhang, Z., Cao, Y., Zhao, X. (2022). A Multi-level Feature Enhancement Network for Image Splicing Localization. In: Zhao, X., Piva, A., Comesaña-Alfaro, P. (eds) Digital Forensics and Watermarking. IWDW 2021. Lecture Notes in Computer Science(), vol 13180. Springer, Cham. https://doi.org/10.1007/978-3-030-95398-0_1

Download citation

  • DOI: https://doi.org/10.1007/978-3-030-95398-0_1

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-95397-3

  • Online ISBN: 978-3-030-95398-0

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics