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Refinement Tree and Its Patterns: A Graphical Approach for Event-B Modeling

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Formal Techniques for Safety-Critical Systems (FTSCS 2013)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 419))

Abstract

Event-B is a famous formal approach for verifying the requirements specification of safety-critical systems. Even though Event-B is a good formal approach which is successful in applying to several practical case studies, we think that additional methods are needed to apply it to the safety critical systems. Once we identify the requirements, Event-B allows us to formally describe the requirements. However, Event-B does not explicitly support analysing and elaborating requirements themselves. Although refinement mechanisms provided by Event-B is useful to stepwise model concrete requirements from abstract ones, guideline of the refinements is not provided. This paper aims to propose a refinement tree diagram and its refinement patterns to provide the requirements analysis and elaboration, and the guideline for Event-B. The diagram and the patterns are partially derived from the KAOS method, a goal-oriented requirements engineering method. The utility of the diagram and the patterns is successfully shown by applying them to three practical case studies.

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Authors and Affiliations

  1. School of Information Science, Japan Advanced Institute of Science and Technology (JAIST), Ishikawa, Japan

    Kriangkrai Traichaiyaporn & Toshiaki Aoki

Authors
  1. Kriangkrai Traichaiyaporn
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  2. Toshiaki Aoki
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Correspondence to Kriangkrai Traichaiyaporn .

Editor information

Editors and Affiliations

  1. AIST, Research Institute for Secure Systems, Amagasaki, Japan

    Cyrille Artho

  2. University of Oslo Department of Informatics, Oslo, Norway

    Peter Csaba Ölveczky

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Traichaiyaporn, K., Aoki, T. (2014). Refinement Tree and Its Patterns: A Graphical Approach for Event-B Modeling. In: Artho, C., Ölveczky, P. (eds) Formal Techniques for Safety-Critical Systems. FTSCS 2013. Communications in Computer and Information Science, vol 419. Springer, Cham. https://doi.org/10.1007/978-3-319-05416-2_16

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  • DOI: https://doi.org/10.1007/978-3-319-05416-2_16

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-05415-5

  • Online ISBN: 978-3-319-05416-2

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