Skip to main content
SpringerLink
Log in

Research on the System Reliability Modeling Based on Markov Process and Reliability Block Diagram

  • Conference paper
Book cover Intelligent Data analysis and its Applications, Volume II

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 298))

Abstract

The on board computer systems have a high requirement on the reliability because of single event upset. So this paper analyzes the system reliability model, and presents a method to model the reliability of on board computer system. This paper defines the basic module of the system reliability using Markov model and proposes a system reliability prediction algorithm using reliability block diagram. By simplifying the reliability block diagram using the graph theory, to predict the reliability of a system.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Petersen, E.: Single event effects in aerospace. Wiley-IEEE Press (2011)

    Google Scholar 

  2. Edmonds, L.D.: Analysis of Single-Event Upset Rates in Triple-Modular Redundancy Devices. NASA Jet Propulsion Laboratory (2009)

    Google Scholar 

  3. Velazco, R., Bessot, D., Duzellier, S., Ecoffet, R., Koga, R.: Two CMOS memory cells suitable for the design of SEU-tolerant VLSI circuits. IEEE Transactions on Nuclear Science 41, 2229–2234 (1994)

    Article  Google Scholar 

  4. McMurtrey, D., Morgan, K., Pratt, B., Wirthlin, M.: Estimating TMR Reliability on FPGAs Using Markov Models. Brigham Young University Department of Electrical and Computer Engineering, Tech. Rep. (2007)

    Google Scholar 

  5. Sahinoglu, M., Chittoor: RBD Tools Using Compression, Decompression Hybrid Techniques to Code, Decode, and Computer Reliability in Simple and Complex Embedded systems. IEEE Transactions on Instrumentation and Measurement 54(5), 1789–1799

    Google Scholar 

  6. Crowe, D., Feinberg, A.: Design for Reliability. CRC Press LCC (2001)

    Google Scholar 

  7. Lin, C.M., Teng, H.K., Yang, C.C., et al.: A mesh network reliability analysis using reliability block diagram. In: 2010 8th IEEE International Conference on Industrial Informatics (INDIN), pp. 975–979. IEEE (2010)

    Google Scholar 

  8. Yanjun, L., Wei, W.: Research on the system of reliability block diagram design and reliability prediction. In: 2011 International Conference on Engineering Design and Manufacturing Informatization (ICSEM), vol. 2, pp. 35–38. IEEE (2011)

    Google Scholar 

  9. Sahner, R.A., Trivedi, K.S.: Performance and reliability analysis using directed acyclic graphs. IEEE Transactions on Software Engineering, 1105–1114 (1987)

    Google Scholar 

  10. Modarres, M.: A method of predicting availability characteristics of series-parallel systems. IEEE Trans., Rel. R-33(4), 308–312 (1984)

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. China Academy of Space Technology(Xi’an), Xi’an, 710000, China

    Guochang Zhou & Xiang Gao

  2. School of Aerospace Science and Technology, Xidian University, Xi’an, 710071, China

    Baolong Guo, Dan Zhao & Yunyi Yan

Authors
  1. Guochang Zhou
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Baolong Guo
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Xiang Gao
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Dan Zhao
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. Yunyi Yan
    View author publications

    You can also search for this author in PubMed Google Scholar

Editor information

Editors and Affiliations

  1. University of Applied Sciences, Kaohsiung, Taiwan

    Jeng-Shyang Pan

  2. Department of Computer Science Faculty of Elec. Eng. & Comp. Sci., VSB-Technical University of Ostrava, Ostrava, Czech Republic

    Vaclav Snasel

  3. Departamento de Informáca y Automática Facultad de Biología, University of Salamanca, Salamanca, Spain

    Emilio S. Corchado

  4. Scientific Network for Innovation and Research Excellence, Machine Intelligence Research Labs (MIR Labs), Auburn, Washington, USA

    Ajith Abraham

  5. Department of Information Management, National University of Kaohsiung, Kaohsiung, Taiwan

    Shyue-Liang Wang

Rights and permissions

Reprints and permissions

Copyright information

© 2014 Springer International Publishing Switzerland

About this paper

Cite this paper

Zhou, G., Guo, B., Gao, X., Zhao, D., Yan, Y. (2014). Research on the System Reliability Modeling Based on Markov Process and Reliability Block Diagram. In: Pan, JS., Snasel, V., Corchado, E., Abraham, A., Wang, SL. (eds) Intelligent Data analysis and its Applications, Volume II. Advances in Intelligent Systems and Computing, vol 298. Springer, Cham. https://doi.org/10.1007/978-3-319-07773-4_54

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-07773-4_54

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-07772-7

  • Online ISBN: 978-3-319-07773-4

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics

Search

Navigation