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Reliability Analysis on Parallel System with N Element Obeying Exponential Distribution

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Book cover Genetic and Evolutionary Computing

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 329))

Abstract

The modern computer and network system, is composed of tens of thousands of components. Any faults in components can affect reliability of the whole system. In the process of running, elements will gradually age and failure rate gradually increase. However, the rate at which these elements age is not synchronous. Thus, in which cases should the elements be upgraded or replaced and in which cases should the elements whose performance is still relatively good be retained, are hard job to handle. In this paper, the author attempts to make an extreme analysis on the reliability of parallel system with N element obeying exponential distribution to improve the system update.

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Author information

Authors and Affiliations

  1. The Institute of Innovative Information Industry, Fuqing Branch of Fujian Normal University, Fuqing, China

    Lu-Xiong Xu & Lin Xu

  2. The School of Mathematics and Computer Science, Fuqing Branch of Fujian Normal University, Fuqing, China

    Lu-Xiong Xu

  3. Network Center, Fuqing Branch of Fujian Normal University, Fuqing, China

    Chao-Fan Xie

  4. The School of Ecomomic, Fujian Normal University, Fuqing, China

    Lin Xu

Authors
  1. Lu-Xiong Xu
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  2. Chao-Fan Xie
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  3. Lin Xu
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Editor information

Editors and Affiliations

  1. HIGH-TECH Industry Development Zone, Nanchang Institute of Technology, Jiangxi Province, China

    Hui Sun

  2. Department of Computer Science and Information Engineering, National Penghu University of Science and Technology, Magong City, Taiwan

    Chin-Yu Yang

  3. Innovative Information Industry Research Center, Shenzhen University Harbin Institute of Technology, Shenzhen, China

    Chun-Wei Lin

  4. Harbin Institute of Technology Innovative Info. Industry Res. Center, Shenzhen University, Shenzhen, China

    Jeng-Shyang Pan

  5. Department of Computer Science Faculty of Elec. Eng. & Comp. Sci., VSB-Technical University of Ostrava, Ostrava, Czech Republic

    Vaclav Snasel

  6. Scientific Network for Innovation and Research Excellence, Machine Intelligence Research Labs (MIR Labs), Auburn, Washington, USA

    Ajith Abraham

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© 2015 Springer International Publishing Switzerland

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Xu, LX., Xie, CF., Xu, L. (2015). Reliability Analysis on Parallel System with N Element Obeying Exponential Distribution. In: Sun, H., Yang, CY., Lin, CW., Pan, JS., Snasel, V., Abraham, A. (eds) Genetic and Evolutionary Computing. Advances in Intelligent Systems and Computing, vol 329. Springer, Cham. https://doi.org/10.1007/978-3-319-12286-1_42

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  • DOI: https://doi.org/10.1007/978-3-319-12286-1_42

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-12285-4

  • Online ISBN: 978-3-319-12286-1

  • eBook Packages: EngineeringEngineering (R0)

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