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A Fast Coplanarity Inspection System for Double-Sides IC Leads Using Single Viewpoint

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Book cover Intelligent Robotics and Applications (ICIRA 2014)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 8918))

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Abstract

A new single camera vision system for online coplanarity inspection of SOP (Small Outline Packaging) IC leads is presented. First, a novel imaging optical structure with multiple reflection mirrors and a total reflection rectangular prism is developed. This structure characterized in that two side views of IC leads are captured one-time in a small FOV (Field Of View). Second, a fast high-precision algorithm to inspect the coplanarity of IC leads is also proposed. Based on the statistical method, the “3Sigma” criterion is used to judge the quality of IC leads’ coplanarity. Finally, the experimental results indicated that the proposed system can inspect IC leads coplanarity in real-time.

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© 2014 Springer International Publishing Switzerland

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Zhong, Q., Zhang, X., Chen, Z. (2014). A Fast Coplanarity Inspection System for Double-Sides IC Leads Using Single Viewpoint. In: Zhang, X., Liu, H., Chen, Z., Wang, N. (eds) Intelligent Robotics and Applications. ICIRA 2014. Lecture Notes in Computer Science(), vol 8918. Springer, Cham. https://doi.org/10.1007/978-3-319-13963-0_22

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  • DOI: https://doi.org/10.1007/978-3-319-13963-0_22

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-13962-3

  • Online ISBN: 978-3-319-13963-0

  • eBook Packages: Computer ScienceComputer Science (R0)

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