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A Novel Method for Detection of Covered Conductor Faults by PD-Pattern Evaluation

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Intelligent Data Analysis and Applications

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 370))

Abstract

The partial discharge activity as a side effect of the current conductor’s disorder was taken into analysis to develop the correct classification of its behavior. This derived knowledge can decrease the risk of the possible damage on the environment caused by uncontrolled conductor’s failure. The preprocessing part of the experiment was the synthesis of non-linear features by genetic programming (GP). The inputs for GP were obtained by discrete wavelet transformation (DWT) of the signal data. This preprocessing phase was aimed to create the input values for the classification algorithm which was based on the artificial neural network (ANN).

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Acknowledgments

This paper was conducted within the framework of the IT4Innovations Centre of Excellence project, reg. no. CZ.1.05/1.1.00/02.0070, project ENET CZ.1.05/2.1.00/03.0069, Students Grant Competition project reg. no. SP2015/142, SP2015/146, SP2015/170, SP2015/178, project LE13011 Creation of a PROGRES 3 Consortium Office to Support Cross-Border Cooperation (CZ.1.07/2.3.00/20.0075) and project TACR: TH01020426.

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Authors and Affiliations

  1. Department of Computer Science, VŠB-Technical University of Ostrava, 17. Listopadu 15, 708 33, Ostrava-Poruba, Czech Republic

    Tomas Vantuch & Tomas Burianek

  2. Faculty of Electrical Engineering and Computer Science, Department of Electrical Power Engineering and IT4Innovations, VŠB-Technical University of Ostrava, 17. Listopadu 15, 708 33, Ostrava-Poruba, Czech Republic

    Stanislav Misak

Authors
  1. Tomas Vantuch
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  2. Tomas Burianek
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  3. Stanislav Misak
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Corresponding author

Correspondence to Tomas Vantuch .

Editor information

Editors and Affiliations

  1. Machine Intelligence Research Labs (MIR Labs), Auburn, Washington, USA

    Ajith Abraham

  2. Fujian University of Technology, Fujian, China

    Xin Hua Jiang

  3. Department of Computer Science, VSB-Technical University of Ostrava, Ostrava-Poruba, Czech Republic

    Václav Snášel

  4. Fujian University of Technology, Fujian, China

    Jeng-Shyang Pan

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Vantuch, T., Burianek, T., Misak, S. (2015). A Novel Method for Detection of Covered Conductor Faults by PD-Pattern Evaluation. In: Abraham, A., Jiang, X., Snášel, V., Pan, JS. (eds) Intelligent Data Analysis and Applications. Advances in Intelligent Systems and Computing, vol 370. Springer, Cham. https://doi.org/10.1007/978-3-319-21206-7_12

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  • DOI: https://doi.org/10.1007/978-3-319-21206-7_12

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-21205-0

  • Online ISBN: 978-3-319-21206-7

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