Abstract
This paper deals with the test-case generation problem for concurrent systems that are specified by true-concurrency models such as Petri nets. We show that using true-concurrency models reduces both the size and the number of test cases needed for achieving certain coverage criteria. We present a test-case generation algorithm based on Petri net unfoldings and a SAT encoding for solving controllability problems in test cases. Finally, we evaluate our algorithm against traditional test-case generation methods under interleaving semantics.
K. Athanasiou—This research was done while the authors were part of LSV, supported by an INRIA internship and the TECSTES project.
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Athanasiou, K., Ponce-de-León, H., Schwoon, S. (2015). Test Case Generation for Concurrent Systems Using Event Structures. In: Blanchette, J., Kosmatov, N. (eds) Tests and Proofs. TAP 2015. Lecture Notes in Computer Science(), vol 9154. Springer, Cham. https://doi.org/10.1007/978-3-319-21215-9_2
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DOI: https://doi.org/10.1007/978-3-319-21215-9_2
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