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Structural Feature Measurement Using Fast VO Model for Blurred Palmprint Recognition

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Biometric Recognition (CCBR 2015)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 9428))

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Abstract

It is inevitable for non-contact palmprint recognition to obtain the low resolution image when capturing the image, which leads to poor recognition accuracy. In order to solve this problem effectively, a blurred palmprint recognition method based on Structure Feature (SF) is proposed in the paper. Firstly, fast Vese-Osher (VO) decomposition model is utilized to decompose blurred images in order to obtain stable feature of blurred images which is regarded as SF. Next, a non-overlapping sampling method based on Structure Ratio (SR) for SF is used to further improve recognition accuracy. Finally, Structural Similarity Index Measurement (SSIM) is used to measure the similarity of palmprints and judge the palmprint category for classification. The recognition results of proposed method are stable in the PolyU palmprint database and the Blurred-PolyU palmprint database, moreover, the Equal Error Rate (EER: 0.9069%) of proposed method is lower than other classical algorithms in Blurred-PolyU palmprint database.

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Authors and Affiliations

  1. College of Information Engineering, Qingdao University, Qingdao, China

    Gang Wang, Weibo Wei, Zhenkuan Pan, Danfeng Hong & Mengqi Jia

Authors
  1. Gang Wang
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  2. Weibo Wei
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  3. Zhenkuan Pan
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  4. Danfeng Hong
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  5. Mengqi Jia
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Corresponding author

Correspondence to Weibo Wei .

Editor information

Editors and Affiliations

  1. Civil Aviation University of China, Tianjin, China

    Jinfeng Yang

  2. and Technology, Tianjin Institute of Science, Tianjin, China

    Jucheng Yang

  3. Institute of Automation, Chinese Academy of Sciences, Beijing, China

    Zhenan Sun

  4. Chinese Academy of Sciences, Beijing, China

    Shiguang Shan

  5. Sun Yat-sen University, Guangzhou, China

    Weishi Zheng

  6. Tsinghua University, Beijing, China

    Jianjiang Feng

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© 2015 Springer International Publishing Switzerland

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Wang, G., Wei, W., Pan, Z., Hong, D., Jia, M. (2015). Structural Feature Measurement Using Fast VO Model for Blurred Palmprint Recognition. In: Yang, J., Yang, J., Sun, Z., Shan, S., Zheng, W., Feng, J. (eds) Biometric Recognition. CCBR 2015. Lecture Notes in Computer Science(), vol 9428. Springer, Cham. https://doi.org/10.1007/978-3-319-25417-3_32

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  • DOI: https://doi.org/10.1007/978-3-319-25417-3_32

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-25416-6

  • Online ISBN: 978-3-319-25417-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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