Skip to main content

Identification of Critical Variables for Soft Error Detection

  • Conference paper
  • First Online:
Human Centered Computing (HCC 2016)

Part of the book series: Lecture Notes in Computer Science ((LNISA,volume 9567))

Included in the following conference series:

Abstract

As process technology scales, electronic devices become more susceptible to soft error induced by radiation. Silent data corruption occurs without any symptoms and is the most severe result incurred by soft error. Duplication is the effective way to protect the program from soft error, but it has high overhead which is increasingly unacceptable for applications. Duplicating critical variables only can significantly reduce the overhead. This paper introduces an approach that identifying the variables which are critical to the execution of the program. We apply Dynamic Dependence Graph to analyze the propagation between instructions and find out the propagation path. The criticality of memory location is characterized and the criticality of each variable is then calculated. Fault injections show that with our approach the duplication achieves high detection rate with low overhead.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Mukherjee, S.S., Emer, J., Reinhardt, S.K.: The soft error problem: an architectural perspective. In: 11th International Symposium on High-Performance Computer Architecture, HPCA-11, pp. 243–247. IEEE (2005)

    Google Scholar 

  2. Racunas, P., Constantinides, K., Manne, S., Mukherjee, S.S.: Perturbation-based fault screening. In: IEEE 13th International Symposium on High Performance Computer Architecture, HPCA 2007, pp. 169–180. IEEE (2007)

    Google Scholar 

  3. Ernst, D., Das, S., Lee, S., Blaauw, D., Austin, T., Mudge, T., Kim, N.S., Flautner, K.: Razor: circuit-level correction of timing errors for low-power operation. IEEE Micro 24(6), 10–20 (2004)

    Article  Google Scholar 

  4. Hari, S.K.S., Adve, S.V., Naeimi, H.: Low-cost program-level detectors for reducing silent data corruptions. In: 2012 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), pp. 1–12. IEEE (2012)

    Google Scholar 

  5. Reis, G.A., Chang, J., Vachharajani, N., Rangan, R., August, D.I.: Swift: software implemented fault tolerance. In: Proceedings of the International Symposium on Code Generation and Optimization, pp. 243–254. IEEE Computer Society (2005)

    Google Scholar 

  6. Chang, J., Reis, G.A., August, D.I.: Automatic instruction-level software-only recovery. In: International Conference on Dependable Systems and Networks, DSN 2006, pp. 83–92. IEEE (2006)

    Google Scholar 

  7. Mitropoulou, K., Porpodas, V., Cintra, M.: DRIFT: decoupled CompileR-based instruction-level fault-tolerance. In: Caṣcaval, C., Montesinos-Ortego, P. (eds.) LCPC 2013. LNCS, vol. 8664, pp. 217–233. Springer, Heidelberg (2014)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Junchi Ma .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2016 Springer International Publishing Switzerland

About this paper

Cite this paper

Ma, J., Wang, Y. (2016). Identification of Critical Variables for Soft Error Detection. In: Zu, Q., Hu, B. (eds) Human Centered Computing. HCC 2016. Lecture Notes in Computer Science(), vol 9567. Springer, Cham. https://doi.org/10.1007/978-3-319-31854-7_28

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-31854-7_28

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-31853-0

  • Online ISBN: 978-3-319-31854-7

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics