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International Conference on Security, Privacy, and Applied Cryptography Engineering

SPACE 2016: Security, Privacy, and Applied Cryptography Engineering pp 213–232Cite as

Predictive Aging of Reliability of Two Delay PUFs

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Part of the book series: Lecture Notes in Computer Science ((LNSC,volume 10076))

Abstract

To protect integrated circuits against IP piracy, Physically Unclonable Functions (PUFs) are deployed. PUFs provide a specific signature for each integrated circuit. However, environmental variations, (e.g., temperature change), power supply noise and more influential IC aging affect the functionally of PUFs. Thereby, it is important to evaluate aging effects as early as possible, preferentially at design time. In this paper we investigate the effect of aging on the stability of two delay PUFs: arbiter-PUFs and loop-PUFs and analyze the architectural impact of these PUFS on reliability decrease due to aging.

We observe that the reliability of the arbiter-PUF gets worse over time, whereas the reliability of the loop-PUF remains constant. We interpret this phenomenon by the asymmetric aging of the arbiter, because one half is active (hence aging fast) while the other is not (hence aging slow). Besides, we notice that the aging of the delay chain in the arbiter-PUF and in the loop-PUF has no impact on their reliability, since these PUFs operate differentially.

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Author information

Authors and Affiliations

  1. ECE Department, Rutgers University, Piscataway, New Jersey, 08854, USA

    Naghmeh Karimi

  2. LTCI, CNRS, Télécom ParisTech, Université Paris-Saclay, 75013, Paris, France

    Jean-Luc Danger & Sylvain Guilley

  3. Secure-IC SAS, 35510, Cesson-Sévigné, France

    Jean-Luc Danger, Florent Lozac’h & Sylvain Guilley

Authors
  1. Naghmeh Karimi
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  2. Jean-Luc Danger
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  3. Florent Lozac’h
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  4. Sylvain Guilley
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Corresponding author

Correspondence to Naghmeh Karimi .

Editor information

Editors and Affiliations

  1. Universities of Paris 8 and Paris 13, LAGA, Paris, France

    Claude Carlet

  2. University of Waterloo, Waterloo, Ontario, Canada

    M. Anwar Hasan

  3. CRRao AIMSCS, Hyderabad, India

    Vishal Saraswat

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Karimi, N., Danger, JL., Lozac’h, F., Guilley, S. (2016). Predictive Aging of Reliability of Two Delay PUFs. In: Carlet, C., Hasan, M., Saraswat, V. (eds) Security, Privacy, and Applied Cryptography Engineering. SPACE 2016. Lecture Notes in Computer Science(), vol 10076. Springer, Cham. https://doi.org/10.1007/978-3-319-49445-6_12

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  • DOI: https://doi.org/10.1007/978-3-319-49445-6_12

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-49444-9

  • Online ISBN: 978-3-319-49445-6

  • eBook Packages: Computer ScienceComputer Science (R0)

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