Skip to main content

Multi-view Continuous Structured Light Scanning

  • Conference paper
  • First Online:

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 10496))

Abstract

We introduce a highly accurate and precise multi-view, multi-projector, and multi-pattern phase scanning method for shape acquisition that is able to handle occlusions and optically challenging materials. The 3D reconstruction is formulated as a two-step process which first estimates reliable measurement samples and then simultaneously optimizes over all cameras, projectors, and patterns. This holistic approach results in significant quality improvements. Furthermore, the acquisition time is drastically reduced by relying on just six high-frequency sinusoidal captures without the need of phase unwrapping, which is implicitly provided by the multi-view geometry.

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   39.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

References

  1. Ajdin, B., Finckh, M., Fuchs, C., Hanika, J., Lensch, H.: Compressive higher-order sparse and low-rank acquisition with a hyperspectral light stage. Citeseer (2012)

    Google Scholar 

  2. Aliaga, D.G., Xu, Y.: Photogeometric structured light: a self-calibrating and multi-viewpoint framework for accurate 3D modeling. In: IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2008, pp. 1–8. IEEE (2008)

    Google Scholar 

  3. Aliaga, D.G., Xu, Y.: A self-calibrating method for photogeometric acquisition of 3d objects. IEEE Trans. Pattern Anal. Mach. Intell. 32(4), 747–754 (2010)

    Article  Google Scholar 

  4. Blais, F.: Review of 20 years of range sensor development. J. Electron. Imaging 13(1), 231–243 (2004)

    Article  Google Scholar 

  5. Chen, T., Lensch, H.P., Fuchs, C., Seidel, H.P.: Polarization and phase-shifting for 3D scanning of translucent objects. In: 2007 IEEE Conference on Computer Vision and Pattern Recognition, pp. 1–8. IEEE (2007)

    Google Scholar 

  6. Chen, T., Seidel, H.P., Lensch, H.P.: Modulated phase-shifting for 3D scanning. In: IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2008, pp. 1–8. IEEE (2008)

    Google Scholar 

  7. Davis, J., Ramamoorthi, R., Rusinkiewicz, S.: Spacetime stereo: a unifying framework for depth from triangulation. In: Proceedigns of the 2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, vol. 2, p. II-359. IEEE (2003)

    Google Scholar 

  8. Furukawa, R., Kawasaki, H.: Dense 3D reconstruction with an uncalibrated stereo system using coded structured light. In: IEEE Computer Society Conference on Computer Vision and Pattern Recognition-Workshops, CVPR Workshops, p. 107. IEEE (2005)

    Google Scholar 

  9. Furukawa, R., Kawasaki, H.: Uncalibrated multiple image stereo system with arbitrarily movable camera and projector for wide range scanning. In: Fifth International Conference on 3-D Digital Imaging and Modeling, 3DIM 2005, pp. 302–309. IEEE (2005)

    Google Scholar 

  10. Furukawa, R., Sagawa, R., Kawasaki, H., Sakashita, K., Yagi, Y., Asada, N.: One-shot entire shape acquisition method using multiple projectors and cameras. In: 2010 Fourth Pacific-Rim Symposium on Image and Video Technology (PSIVT), pp. 107–114. IEEE (2010)

    Google Scholar 

  11. Garcia, R.R., Zakhor, A.: Consistent stereo-assisted absolute phase unwrapping methods for structured light systems. IEEE J. Sel. Top. Sig. Process. 6(5), 411–424 (2012)

    Article  Google Scholar 

  12. Granados, M., Ajdin, B., Wand, M., Theobalt, C., Seidel, H.P., Lensch, H.P.: Optimal HDR reconstruction with linear digital cameras. In: 2010 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), pp. 215–222. IEEE (2010)

    Google Scholar 

  13. Gühring, J.: Dense 3D surface acquisition by structured light using off-the-shelf components. In: Photonics West 2001-Electronic Imaging, pp. 220–231. International Society for Optics and Photonics (2000)

    Google Scholar 

  14. Gupta, M., Agrawal, A., Veeraraghavan, A., Narasimhan, S.G.: Structured light 3D scanning in the presence of global illumination. In: 2011 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), pp. 713–720. IEEE (2011)

    Google Scholar 

  15. Gupta, M., Nayar, S.K.: Micro phase shifting. In: 2012 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), pp. 813–820. IEEE (2012)

    Google Scholar 

  16. Moreno, D., Son, K., Taubin, G.: Embedded phase shifting: robust phase shifting with embedded signals. In: 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), pp. 2301–2309. IEEE (2015)

    Google Scholar 

  17. Nayar, S.K., Krishnan, G., Grossberg, M.D., Raskar, R.: Fast separation of direct and global components of a scene using high frequency illumination. In: ACM Transactions on Graphics (TOG), vol. 25, pp. 935–944. ACM (2006)

    Google Scholar 

  18. Nelder, J.A., Mead, R.: A simplex method for function minimization. Comput. J. 7(4), 308–313 (1965)

    Article  MathSciNet  MATH  Google Scholar 

  19. Resch, B., Lensch, H.P., Wang, O., Pollefeys, M., Hornung, A.S.: Scalable structure from motion for densely sampled videos. In: CVPR (2015)

    Google Scholar 

  20. Salvi, J., Fernandez, S., Pribanic, T., Llado, X.: A state of the art in structured light patterns for surface profilometry. Pattern Recogn. 43(8), 2666–2680 (2010)

    Article  MATH  Google Scholar 

  21. Schwartz, C., Sarlette, R., Weinmann, M., Klein, R.: Dome II: a parallelized BTF acquisition system. In: Rushmeier, H., Klein, R. (eds.) Eurographics Workshop on Material Appearance Modeling: Issues and Acquisition, pp. 25–31. Eurographics Association, June 2013. http://diglib.eg.org/EG/DL/WS/MAM/MAM2013/025-031.pdf

  22. Seitz, S.M., Curless, B., Diebel, J., Scharstein, D., Szeliski, R.: A comparison and evaluation of multi-view stereo reconstruction algorithms. In: 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2006), vol. 1, pp. 519–528. IEEE (2006)

    Google Scholar 

  23. Srinivasan, V., Liu, H.C., Halioua, M.: Automated phase-measuring profilometry: a phase mapping approach. Appl. Opt. 24(2), 185–188 (1985). http://ao.osa.org/abstract.cfm?URI=ao-24-2-185

  24. Weinmann, M., Schwartz, C., Ruiters, R., Klein, R.: A multi-camera, multi-projector super-resolution framework for structured light. In: 2011 International Conference on 3D Imaging, Modeling, Processing, Visualization and Transmission (3DIMPVT), pp. 397–404. IEEE (2011)

    Google Scholar 

  25. Young, M., Beeson, E., Davis, J., Rusinkiewicz, S., Ramamoorthi, R.: Viewpoint-coded structured light. In: IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2007, pp. 1–8. IEEE (2007)

    Google Scholar 

Download references

Acknowledgement

This work was supported by the German Research Foundation (DFG): SFB 1233, Robust Vision: Inference Principles and Neural Mechanisms, TP 2.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Fabian Groh .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2017 Springer International Publishing AG

About this paper

Cite this paper

Groh, F., Resch, B., Lensch, H.P.A. (2017). Multi-view Continuous Structured Light Scanning. In: Roth, V., Vetter, T. (eds) Pattern Recognition. GCPR 2017. Lecture Notes in Computer Science(), vol 10496. Springer, Cham. https://doi.org/10.1007/978-3-319-66709-6_30

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-66709-6_30

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-66708-9

  • Online ISBN: 978-3-319-66709-6

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics