Abstract
This chapter is updated from an earlier version [63]. In the few years since that book chapter was written, there have been several thousand papers published on the topic of memristors, but very few new compact memristor models have appeared. This is not a reflection of the maturity of the field but rather the difficulty of constructing an accurate and predictive compact mathematical model for an electronic circuit element that displays memristor behavior. Given the rapid advances in the field in general, it is time to provide another snapshot of the state of memristor modeling, even though any such attempt will be incomplete. Such models are essential for designing and simulating complex integrated circuits that contain memristors, and the types of applications being considered are increasing significantly. Although the fundamental equations that specify the device physics may be known, they usually comprise a set of coupled nonlinear integro-differential equations that are extremely challenging to solve in three dimensions, and standard multi-physics solvers may not have all the components needed for an accurate model. A numerical solution of the physics equations can require supercomputers and long execution times, which makes this approach useless for interactive simulation of large circuits that contain many such elements. Thus, the equations must be simplified dramatically, and it is not always clear which terms are the most important for the behavior of the device. On the other hand, a purely black box approach of fitting a set of experimental measurements to a convenient functional form runs the risk of poorly representing the behavior of the device in operating regimes outside the range in which the data were collected. Thus, a hybrid approach is necessary, in which the mathematical formalism for a memristor provides the framework for the model and knowledge of the device physics defines the state variable(s), operating limits and asymptotic behavior necessary to make the model useful. After describing the challenge, the art and science of constructing a memristor model are illustrated by three examples: a completely rewritten description of a locally active and volatile device based on a thin film of niobium dioxide that undergoes both a thermal instability and an insulator to metal transition because of Joule heating, the original description of a nonvolatile memory device based on titanium dioxide in which the effective width of an electron tunnel barrier is determined by oxygen vacancy drift caused by an applied electric field, and the recent detailed examination of the transport properties and identification of the primary state variable for tantalum oxide.
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Abdalla, H., Pickett, M.D.: SPICE modeling of memristors. In: 2011 IEEE International Symposium of Circuits and Systems (ISCAS), pp. 1832–1835 (2011)
Adhikari, S.P., Sah, M.P., Kim, H., Chua, L.O.: Three fingerprints of memristor. IEEE Trans. Circuits Syst. I Regul. Pap. 60, 3008 (2013)
Alexandrov, A.S., Bratkovsky, A.M., Bridle, B., Savelev, S.E., Strukov, D.B., Williams, R.S.: Current-controlled negative differential resistance due to Joule heating in TiO2. Appl. Phys. Lett. 99, 202104 (2011)
Ascoli, A., Slesazeck, S., Mahne, H., Tetzlaff, R., Mikolajick, T.: Nonlinear dynamics of a locally-active memristor. In: IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 62, p. 1165 (2015a)
Ascoli, A., Tetzlaff, R., Chua, L.: Robust simulation of a TaO memristor model. Radioengineering 24(384–392) (2015b)
Ascoli, A., Tetzlaff, R., Chua, L.O., Strachan, J.P., Williams, R.S.: History erase effect in a non-volatile memristor. IEEE Trans. Circuits Syst. 63, 389–400 (2016)
Ascoli, A., Tetzlaff, R., Chua, L.: Continuous and differentiable approximation of a TaO memristor model for robust numerical simulations. In: Springer Proceedings in Physics, vol. 191, pp. 61–69 (2017)
Berglund, C.N.: Thermal filaments in vanadium dioxide. IEEE Trans. Electron Devices 16, 432 (1969)
Choi, J., Torrezan, A.C., Strachan, J.P., Kotula, P.G., Lohn, A.J., Marinella, M.J., Li, Z., Williams, R.S., Yang, J.J.: High-speed and low-energy nitride memristors. Adv. Func. Mater. 26, 5290–5296 (2016)
Chopra, K.L.: Current-controlled negative resistance in thin niobium oxide films. Proc. IEEE 51, 941–942 (1963)
Chua, L.O.: Introduction to nonlinear network theory. McGraw-Hill, New York (1969)
Chua, L.O.: Memristor—the missing circuit element. IEEE Trans. Circuit Theory 18, 507–519 (1971)
Chua, L.O., Kang, S.M.: Memristive devices and systems. Proc. IEEE 64, 209–223 (1976)
Chua, L.O.: Device modeling via basic nonlinear circuit elements. IEEE Trans. Circuits Systems CAS 27, 1014–1044 (1980)
Chua, L.O.: Nonlinear Circuits. IEEE Trans. Circuits Systems CAS 31, 69–87 (1984)
Chua, L.O.: Nonlinear foundations for nanodevices, part I: The four-element torus. Proc. IEEE 91, 1830–1859 (2003)
Chua, L.O.: Local activity is the origin of complexity. Int J of Bifurcation and Chaos 15, 3435–3456 (2005)
Chua, L.O.: Resistance switching memories are memristors. Appl. Phys. A 102, 765–783 (2011)
Chua, L.O., Sbitnev, V., Kim, H.: Hodgkin-Huxley axon is made of memristors. Int. J. Bifurc. Chaos 22, 1230011 (2012a)
Chua, L.O., Sbitnev, V., Kim, H.: Neurons are poised near the edge of chaos. Int. J. Bifurc. Chaos 22, 1250098 (2012b)
Chua, L.O.: The fourth element. Proc. IEEE 100, 1920–1927 (2012)
Chua, L.: Memristor, hodgkin-huxley, and edge of chaos. Nanotechnology 24, 383001 (2013)
Chua, L.: If it’s pinched it’s a memristor. Semicond. Sci. Technol. 29, 104001 (2014)
Chua, L.: Everything you wish to know about memristors but are afraid to ask. Radioengineering 24, 319–368 (2015)
Crane, H.D.: The neuristor. IRE Trans. Electronic Computers EC 9, 370–371 (1960)
Geppert, D.V.: A new negative-resistance device. Proc. IEEE 51, 223 (1963)
Gibson, G., Musunuru, M., Zhang, J., Vandenberghe, K., Lee, J., Hsieh, C.C., Jackson, W., Jeon, Y., Henze, D., Li, Z., Williams, R.S.: An accurate locally active memristor model for S-type negative differential resistance in NbOx. Appl. Phys. Lett. 108, 023505 (2016)
Goldfarb, I., Miao, F., Yang, J.J., Yi, W., Strachan, J.P., Zhang, M.X., Pickett, M.D., Medeiros-Ribeiro, G., Williams, R.S.: Electronic structure and transport measurements of amorphous transition-metal oxides: observation of Fermi glass behavior. Appl. Phys. A 107, 1–11 (2012)
Graves, C.E., Dávila, N., Merced-Grafals, E.J., Lam, S.T., Strachan, J.P., Williams, R.S.: Temperature- and field-dependent transport measurements in continuously tunable tantalum oxide memristors expose the dominant state variable. Appl. Phys. Lett. 110, 123501 (2017)
Guckenheimer J, Holmes P (1983) in Nonlinear oscillations, dynamical systems, and bifurcations of vector fields. Springer, New York 117–165
Hodgkin, A.L., Huxley, A.F.: A quantitative description of membrane current and its application to conduction and excitation in nerve. J. Physiol. 117, 500–544 (1952)
Hu, M., Strachan, J.P., Li, Z., Williams, R.S.: Dot-product engine as computing memory to accelerate machine learning algorithms. In: IEEE 17th International Symposium on Quality Electronic Design (ISQED), pp. 374–379 (2016a)
Hu, M., Strachan, J.P., Li, Z., Merced Grafals, E., Davila, N., Graves, C., Lam, S., Ge, N., Williams, R.S., Yang, J.J.: Dot-product engine for neuromorphic computing: programming 1T1M crossbar to accelerate matrix-vector multiplication. In: IEEE Design Automation Conference (DAC), pp.1–6 (2016b)
Itoh, M., Chua, L.O.: Memristor oscillators. Int. J. Bifurcation Chaos 18, 3183–3206 (2008)
Itoh, M., Chua, L.O.: Parasitic effects on memristor dynamics. Int. J. Bifurcat. Chaos 26, 1630014 (2016)
Jannick, R.F., Whitmore, D.H.: Electrical conductivity and thermoelectric power of niobium dioxide. J. Phys. Chem. Solids 27, 1183 (1966)
Kumar, S., Pickett, M.D., Strachan, J.P., Gibson, G., Nishi, Y., Williams, R.S.: Local temperature redistribution and structural transition during Joule-heating-driven conductance switching in VO2. Adv. Mater. 25, 6128 (2013)
Kumar, S., Graves, C.E., Strachan, J.P., Grafals, EM., Kilcoyne, A.L.D., Tyszczak, T., Weker, J.N., Nishi, Y., Williams, R.S.: Direct observation of localized radial oxygen migration in functioning tantalum oxide memristors. Adv. Mater. 28,2272–2276 (2016a)
Kumar, S., Wang, Z., Huang, X., Kumari, N., Dávila, N., Strachan, J.P., Vine, D., Kilcoyne, A.L.D., Nishi, Y., Williams, R.S.: Conduction channel formation and dissolution due to oxygen thermophoresis/diffusion in hafnium oxide memristors. ACS Nano 10, 11205–19 (2016b)
Kumar, S., Strachan, J.P., Williams, R.S.: Chaotic dynamics in a nanoscale NbO2 Mott memristor. Nature 548, 318–321 (2017)
Kumar, S., Wang, Z., Davila, N., Kumari, N., Norris, K.J., Huang, X., Strachan, J.P., Vine, D., Kilcoyne, A.L.D., Nishi,Y., Williams, R.S.: Physical characterization of current- and temperature-controlled negative differential resistances in NbO2. Nat. Commun. (2017)
Lee, S.R., Kim, Y.B., Chang, M., Kim, K.M., Lee, C.B., Hur, J.H., Park, G.Y., Lee, D., Lee, M.J., Kim, C.J., Chung, U.I., Yoo, I.K., Kim, K.: Multi-level switching of triple-layered TaOx RRAM with excellent reliability for storage class memory. In: IEEE Symposium on VLSI Technology (VLSIT), pp. 71–72 (2012)
Mannan, Z.I., Choi, H., Kim, H.: Chua corsage memristor oscillator via hopf bifurcation. Int. J. Bifurcat. chaos 26, 1630009 (2016)
Mainzer, K., Chua, L.: Local Activity Principle. Imperial College Press, London (2013)
Medeiros-Ribeiro, G., Perner, F., Carter, R., Abdalla, H., Pickett, M.D., Williams, R.S.: Lognormal switching times for titanium dioxide bipolar memristors: origin and resolution. Nanotechnology 22, 095702 (2011)
Merced-Grafals, E.J., Dávila, N., Ge, N., Williams, R.S., Strachan, J.P.: Repeatable, accurate, and high speed multi-level programming of memristor 1T1R arrays for power efficient analog computing applications. Nanotechnology 27, 365202 (2016)
Mott, N.F., Davis, E.A.: Electronic Processes in Non-Crystalline Materials. Clarendon, Oxford (1979)
Pickett, M.D., Strukov, D.B., Borghetti, J.L., Yang, J.J., Snider, G.S., Stewart, D.R., Williams, R.S.: Switching dynamics in titanium dioxide memristive devices. J. Appl. Phys. 106, 074508 (2009)
Pickett, M.D., Williams, R.S.: Sub-100 femtoJoule and sub-nanosecond thermally-driven threshold switching in niobium oxide crosspoint nanodevices. Nanotechnology 23, 215202 (2012)
Pickett, M.D., Medeiros-Ribeiro, G., Williams, R.S.: A scalable neuristor built with Mott memristors. Nat. Mater. 12, 114–117 (2013)
Prakash, A., Deleruyelle, D., Song, J., Bocquet, M., Hwang, H.: Resistance controllability and variability improvement in a TaOx-based resistive memory for multilevel storage application. Appl. Phys. Lett. 106, 233104 (2015)
Ramprasad, R.: First principles study of oxygen vacancy defects in tantalum pentoxide. J. Appl. Phys. 94, 5609–5612 (2003)
Ridley, B.K.: Specific negative resistance in solids. Proc. Phys. Soc. London 82, 954 (1963)
Sah, MPd, Yang, C., Kim, H., Muthuswamy, B., Jevtic, J., Chua, L.: A generic model of memristors with parasitic components. IEEE Trans. Circuits Syst. I Regul. Pap. 62, 891–898 (2015)
Sethupathi, K., Kim, H., Shah, M.P.d., Chua, L.O.: Memristor modelling. In: Proceedings—IEEE International Symposium on Circuits and Systems, art. no. 6865179, pp. 490–493 (2014)
Strachan, J.P., Torrezan, A.C., Medeiros-Ribeiro, G., Williams, R.S.: Measuring the switching dynamics and energy efficiency of tantalum oxide memristors. Nanotechnology 22, 505402 (2011)
Strachan, J.P., Torrezan, A.C., Miao, F., Pickett, M.D., Yang, J.J., Yi, W., Medeiros-Ribeiro, G., Williams, R.S.: State dynamics and modeling of tantalum oxide memristors. IEEE Trans. Electr. Devices 60, 2491–2202 (2013)
Strukov, D.B., Snider, G.S., Stewart, D.R., Williams, R.S.: The missing memristor found. Nature 453, 80–83 (2008)
Strukov, D.B., Williams, R.S.: Exponential ionic drift: fast switching and low volatility of thin-film memristors. Appl. Phys. A 94, 515–519 (2009)
Strukov, D.B., Borghetti, J.L., Williams, R.S.: Coupled ionic and electronic transport model of thin-film semiconductor memristive behavior. Small 5, 1058–1063 (2009)
Strukov, D.B., Alibart, F., Williams, R.S.: Thermophoresis/diffusion as a mechanism for unipolar resistive switching in metal-oxide-metal memristors. Appl. Phys. A 107, 509–518 (2012)
Sze, S.M., Ng, K.K.: Physics of Semiconductor Devices. Hoboken, New Jersey (2006)
Williams, R.S., Pickett, M.D.: The art and science of constructing a memristor model. In: Memristors and Memristive Systems, pp.93–104. Springer, New York (2014)
Yang, J.J., Strukov, D.B., Stewart, D.R.: Memristive devices for computing. Nat. Nanotechnol. 8, 13–24 (2013)
Yi, W., Savel’ev, S., Medeiros-Ribeiro, G., Miao, F., Zhang, M., Yang, J.J., Bratkovsky, A.M., Williams, R.S.: Quantized conductance coincides with state instability and excess noise in tantalum oxide memristors. Nat. Commun. 7, 11142 (2016)
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Kumar, S., Gibson, G., Graves, C.E., Pickett, M.D., Strachan, J.P., Stanley Williams, R. (2019). The Art and Science of Constructing a Memristor Model: Updated. In: Chua, L., Sirakoulis, G., Adamatzky, A. (eds) Handbook of Memristor Networks. Springer, Cham. https://doi.org/10.1007/978-3-319-76375-0_9
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