Abstract
Computing at ultra-low voltages can increase the energy efficiency significantly, however, operating frequency and resilience to errors degrade as the operating voltage reaches the transistor threshold voltage. More parallelism can help prevent degradation in throughput performance arising from the lower frequency. More parallelism, however, makes more components subject to errors, which exacerbates the already intensified vulnerability to errors. This chapter is all about how to exploit the intrinsic noise tolerance of emerging R(ecognition), M(ining), and S(ynthesis) applications in addressing degraded resilience at ultra-low voltages by embracing errors.
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Kim, N.S., Karpuzcu, U.R. (2019). Approximate Ultra-Low Voltage Many-Core Processor Design. In: Reda, S., Shafique, M. (eds) Approximate Circuits. Springer, Cham. https://doi.org/10.1007/978-3-319-99322-5_18
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