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A Test Cost Sensitive Heuristic Attribute Reduction Algorithm for Partially Labeled Data

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Book cover Rough Sets (IJCRS 2018)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 11103))

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Abstract

Attribute reduction is viewed as one of the most important topics in rough set theory and there have been many researches on this issue. In the real world, partially labeled data is universal and cost sensitivity should be taken into account under some circumstances. However, very few studies on attribute reduction for partially labeled data with test cost have been carried out. In this paper, based on mutual information, the significance of an attribute in partially labeled decision system with test cost is defined, and for labeled data, a heuristic attribute reduction algorithm TCSPR is proposed. Experimental results show the impact of test cost on reducts for partially labeled data and comparative experiments of classification accuracy indicate the effectiveness of the proposed method.

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Acknowledgements

The authors would like to thank the anonymous reviewers for their constructive comments that help improve the manuscript. This research was supported by the National Key R&D Program of China (213), National Natural Science Foundation of China (61673301), Major Project of Ministry of Public Security (20170004), and the Open Research Funds of State Key Laboratory for Novel Software Technology (KFKT2017B22).

Author information

Authors and Affiliations

  1. Department of Computer Science and Technology, Tongji University, Shanghai, 201804, China

    Shengdan Hu, Duoqian Miao, Zhifei Zhang, Sheng Luo & Yuanjian Zhang

  2. Key Laboratory of Embedded System and Service Computing, Ministry of Education, Tongji University, Shanghai, 201804, China

    Shengdan Hu, Duoqian Miao, Sheng Luo, Yuanjian Zhang & Guirong Hu

  3. Department of Computer Science, Shanghai Normal University Tianhua College, Shanghai, 201815, China

    Shengdan Hu

  4. State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, 210023, China

    Zhifei Zhang

Authors
  1. Shengdan Hu
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  2. Duoqian Miao
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  3. Zhifei Zhang
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  4. Sheng Luo
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  5. Yuanjian Zhang
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  6. Guirong Hu
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Corresponding author

Correspondence to Duoqian Miao .

Editor information

Editors and Affiliations

  1. University of Warsaw, Warsaw, Poland

    Hung Son Nguyen

  2. Faculty of Information Technology, Vietnam National University, Hanoi, Vietnam

    Quang-Thuy Ha

  3. School of Information Science, Southwest Jiaotong University, Chengdu, China

    Tianrui Li

  4. Institute of Computer Science, University of Silesia, Sosnowiec, Poland

    Małgorzata Przybyła-Kasperek

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Hu, S., Miao, D., Zhang, Z., Luo, S., Zhang, Y., Hu, G. (2018). A Test Cost Sensitive Heuristic Attribute Reduction Algorithm for Partially Labeled Data. In: Nguyen, H., Ha, QT., Li, T., Przybyła-Kasperek, M. (eds) Rough Sets. IJCRS 2018. Lecture Notes in Computer Science(), vol 11103. Springer, Cham. https://doi.org/10.1007/978-3-319-99368-3_20

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  • DOI: https://doi.org/10.1007/978-3-319-99368-3_20

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-99367-6

  • Online ISBN: 978-3-319-99368-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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