Abstract
In this paper the problem of deriving high quality tests for fast combinational floatingpoint realizations is investigated. Floating-point circuits are heterogeneous, consisting of a large number of regular and irregular modules. Thus, the test strategy applied combines specialized structure based methods and universal test generation. In order to guarantee sufficient controllability and observability of embedded modules small hardware modifications are proposed. As a result we obtain optimal time floatingpoint circuits for arbitrary operand lengths which can be tested completely with respect to a strong fault model by a minimal number of test patterns.
This work has been supported by the ‘Leibniz-Preis’ awarded to Prof. Dr. G. Hotz in 1987.
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© 1992 B. G. Teubner Verlagsgesellschaft, Leipzig
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Sparmann, U. (1992). Derivation of High Quality Tests for Large Heterogeneous Circuits: Floating-Point Operations. In: Buchmann, J., Ganzinger, H., Paul, W.J. (eds) Informatik. TEUBNER-TEXTE zur Informatik, vol 1. Vieweg+Teubner Verlag, Wiesbaden. https://doi.org/10.1007/978-3-322-95233-2_26
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DOI: https://doi.org/10.1007/978-3-322-95233-2_26
Publisher Name: Vieweg+Teubner Verlag, Wiesbaden
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