Abstract
This paper presents an approach, which is applicable to parallel testing, to the generation of test patterns using the partitioning technique based on the exhaustive testing scheme. The suggested method can discover faults faster than the exhaustive testing scheme. It also shows that testing can be performed in parallel using the functionally partitioned blocks, rather than in linear. In this paper, a functional level description as well as the Boolean differential is used to generate a test pattern that can be inserted into in parallel.
This work was supported by Kyungnam University Research Fund.
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Kim, W.W. (2004). Parallel Testing Method by Partitioning Circuit Based on the Exhaustive Test. In: Laganá, A., Gavrilova, M.L., Kumar, V., Mun, Y., Tan, C.J.K., Gervasi, O. (eds) Computational Science and Its Applications – ICCSA 2004. ICCSA 2004. Lecture Notes in Computer Science, vol 3044. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-24709-8_28
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DOI: https://doi.org/10.1007/978-3-540-24709-8_28
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