Abstract
In this paper, a wavelet-based multiscale asymmetric dissimilarity measure for shape matching is proposed. The wavelet transform is used to decompose the shape boundary into a multiscale representation. Given two shapes, a distance matrix is computed from the moment invariants of the wavelet coefficients at all the scale levels. The asymmetric dissimilarity is then calculated from the minimum values across each row on the distance matrix. The proposed asymmetric dissimilarity is a Hausdorff-like measure and is used for finding globally related shapes. The similarity paths obtained from the locations of the minimum distance values can be used to illustrate these relations.
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References
Loncaric, S.: A survey of shape analysis techniques. Pattern Recognition 31, 983–1001 (1998)
Veltkamp, R., Hagedoorn, M.: State-of-the-art in shape matching. In: M.L. ed.: . Principles of Visual Information Retrieval, pp. 87–119. Springer, Heidelberg (2001)
Huttenlocher, D., Klanderman, D., Rucklige, A.: Comparing images using the Hausdorff distance. IEEE Transactions on Pattern Analysis and Machine Intelligence 15, 850–863 (1993)
Chauang, G., Kuo, C.: Wavelet descriptor of planar curves: Theory and applications. IEEE Transaction on Image Processing 5, 56–70 (1996)
Kashi, R., B-Kavde, P., Nowakowski, R., Papathomas, T.: 2-D shape representation and averaging using normalized wavelet descriptors. Simulation 66, 164–178 (1996)
Alferez, R., Wang, Y.: Geometric and illumination invariants for object recognition. IEEE Trans. on PAMI 21, 505–536 (1999)
Tieng, Q., Boles, W.: An application of wavelet based affine invariant representation. Pattern Recognition Letters 16, 1287–1296 (1995)
Khalil, M., Bayoumi, M.: Affine invariants for object recognition using the wavelet transform. Pattern Recognition Letters 23, 57–72 (2002)
Chen, G.: Applications of wavelet transformation in pattern recognition and denoising. Master thesis, Concordia University (1999)
Lin, W., Chen, C., Sun, Y.: Multiscale object recognition under affine transformation. IEICE Transaction Information and Systems E82d, 1474–1482 (1999)
Ohm, J.R., Bunjamin, F., Liebsch, W., Makai, B., Mller, K.A., Smolic, D.Z.: A set of visual descriptors and their combination in a low-level description scheme. Signal Processing: Image Communication 16, 157–179 (2000)
Zhao, D., Chen, J.: Affine curve moment invariants for shape recognition. Pattern Recognition 30, 895–901 (1997)
Flusser, J., Suk, T.: A moment-based approach to registration of images with affine geometric distortion. IEEE Transactions on Geoscience and Remote Sensing 32, 382–387 (1994)
Latecki, P.L.J. http://www.cis.temple.edu/ (latecki/)
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El Rube’, I., Kamel, M., Ahmed, M. (2004). 2-D Shape Matching Using Asymmetric Wavelet-Based Dissimilarity Measure. In: Campilho, A., Kamel, M. (eds) Image Analysis and Recognition. ICIAR 2004. Lecture Notes in Computer Science, vol 3211. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-30125-7_46
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DOI: https://doi.org/10.1007/978-3-540-30125-7_46
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-23223-0
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