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Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 3254))

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Abstract

Low-voltage high-density embedded (e-) RAMs, focusing on RAM cells and peripheral circuits, are described. First, challenges and trends in low-voltage e-RAMs are described based on the S/N issue of RAM cells, and leakage and speed-variation issues of peripheral circuits. Next, state-of-the-art low-voltage e-DRAMs and e-SRAMs are investigated, focusing on leakage-reduction circuits. Finally, future prospects for e-RAM cells and peripheral circuits are discussed in terms of low-voltage designs.

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References

  1. Itoh, K.: VLSI Memory Chip Design. Springer, New York (2001)

    MATH  Google Scholar 

  2. Nakagome, Y., et al.: Review and prospects of low-voltage RAM circuits. IBM J. R & D 47(5/6), 525–552 (2003)

    Article  Google Scholar 

  3. Kamei, T., et al.: A Resume-Standby Application Processor for 3G Cellular Phones. In: 2004 ISSCC Dig. Tech. Papers, February 2004, pp. 336–337 (2004)

    Google Scholar 

  4. Yamaoka, M., et al.: A 300 MHz 25μA/Mb Leakage On-Chip SRAM Module Featuring Process-Variation Immunity and Low-Leakage-Active Mode for Mobile-Phone Application Processor. In: 2004 ISSCC Dig. Tech. Papers, February 2004, pp. 494–495 (2004)

    Google Scholar 

  5. Hardee, K., et al.: A 0.6V 205MHz 19.5ns tRC 16Mb Embedded DRAM. In: 2004 ISSCC Dig. Tech. Papers, February 2004, pp. 494–495 (2004)

    Google Scholar 

  6. Morishita, F., et al.: A 312MHz 16Mb Random-Cycle Embedded DRAM Macro with 73 μW Power-Down Mode for Mobile Applications. In: 2004 ISSCC Dig. Tech. Papers, February 2004, pp. 202–203 (2004)

    Google Scholar 

  7. Yamaoka, M., et al.: Low Power SRAM Menu for SOC Application Using Yin-Yang- Feedback Memory Cell Technology. In: Symp. VLSI Circuits Dig. (June 2004)

    Google Scholar 

  8. Nii, K., et al.: A 90 nm Low Power 32K-Byte Embedded SRAM with Gate Leakage Suppression Circuit for Mobile Applications. In: Symp. VLSI Circuits Dig., June 2003, pp. 247–150 (2003)

    Google Scholar 

  9. Inukai, T., Hiramoto, T.: Suppression of Stand-by Tunnel Current in Ultra-Thin Gate Oxide MOSFETs by Dual Oxide Thickness MTCMOS(DOT-MTCMOS). In: Ext. Abst. 1999 Int’l Conf. SSDM, Tokyo, pp. 264–265 (1999)

    Google Scholar 

  10. Osada, K., et al.: 16.7fA/cell Tunnel-Leakage-Suppressed 16Mb SRAM for Handling Cosmic-Ray-Induced Multi-Errors. In: 2003 ISSCC Dig. Tech. Papers, February 2003, pp. 302–303 (2003)

    Google Scholar 

  11. Noda, H., et al.: A 143MHz 1.1W 4.5Mb Dynamic TCAM with Hierarchical Searching and Shift Redundancy Architecture. In: 2004 ISSCC Dig. Tech. Papers, February 2004, pp. 208–209 (2004)

    Google Scholar 

  12. Nahas, J., et al.: A 4Mb 0.18μm 1T1MTJ Toggle MRAM Memory. In: 2004 ISSCC Dig. Tech. Papers, February 2004, pp. 44–45 (2004)

    Google Scholar 

  13. Cho, W.Y., et al.: A 0.18μm 3.0V 64Mb Non-Volatile Phase-Transition Random-Access Memory(PRAM). In: 2004 ISSCC Dig. Tech. Papers, February 2004, pp. 40–41 (2004)

    Google Scholar 

  14. Nakagome, Y., et al.: Symp. VLSI Circuits Dig., June 1992, pp. 82–83 (1992)

    Google Scholar 

  15. Kawahara, T., et al.: Subthreshold current reduction for decoded-driver by self-reverse biasing. IEEE J. Solid-State Circuits 28, 1136–1144 (1993)

    Article  Google Scholar 

  16. Horiguchi, M., et al.: Switched-source-impedance CMOS circuit for low standby subthreshold current giga-scale LSI’s. IEEE J. Solid-State Circuits 28, 1131–1135 (1993)

    Article  Google Scholar 

  17. Sakata, T., et al.: Subthreshold-current reduction circuits for multi-gigabit DRAM’s. IEEE J. Solid-State Circuits 29, 761–769 (1994)

    Article  Google Scholar 

  18. Osada, K., et al.: Universal-Vdd 0.65-2.0V 32 kB Cache using Voltage-Adapted Timing- Generation Scheme and a Lithographical-Symmetric Cell. In: 2001 ISSCC, Dig. Tech. Papers, February 2001, pp. 168–169 (2001)

    Google Scholar 

  19. Itoh, K., et al.: Review and Future Prospects of Low-voltage Embedded RAMs. In: CICC2004 Dig. (October 2004)

    Google Scholar 

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© 2004 Springer-Verlag Berlin Heidelberg

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Itoh, K., Osada, K., Kawahara, T. (2004). Low-Voltage Embedded RAMs – Current Status and Future Trends. In: Macii, E., Paliouras, V., Koufopavlou, O. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2004. Lecture Notes in Computer Science, vol 3254. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-30205-6_3

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  • DOI: https://doi.org/10.1007/978-3-540-30205-6_3

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-23095-3

  • Online ISBN: 978-3-540-30205-6

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