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Timed I/O Test Sequences for Discrete Event Model Verification

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Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 3397))

Abstract

Model verification examines the correctness of a model implementation with respect to a model specification. While being described from model specification, implementation prepares to execute or evaluate a simulation model by a computer program. Viewing model verification as a program test this paper proposes a method for generation of test sequences that completely covers all possible behavior in specification at an I/O level. Timed State Reachability Graph (TSRG) is proposed as a means of model specification. Graph theoretical analysis of TSRG has generated a test set of timed I/O event sequences, which guarantees 100% test coverage of an implementation under test.

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© 2005 Springer-Verlag Berlin Heidelberg

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Hong, K.J., Kim, T.G. (2005). Timed I/O Test Sequences for Discrete Event Model Verification. In: Kim, T.G. (eds) Artificial Intelligence and Simulation. AIS 2004. Lecture Notes in Computer Science(), vol 3397. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-30583-5_30

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  • DOI: https://doi.org/10.1007/978-3-540-30583-5_30

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-24476-9

  • Online ISBN: 978-3-540-30583-5

  • eBook Packages: Computer ScienceComputer Science (R0)

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