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Detection of Various Defects in TFT-LCD Polarizing Film

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Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 4432))

Abstract

The increasing use of TFT-LCDs has generated a great deal of interest in manufacturing defects on TFT-LCD polarizing film because the poor quality of TFT-LCD polarizing film result in undesirable effects on the TFT-LCD display devices. In this paper, we propose a new inspection method that reliably detects various defects of TFT-LCD polarizing films. First, we apply a least mean squares adaptive filtering technique to remove background noise. Next, we use statistical characteristics to detect possible defects. Finally, we make a binary image to identify weather the TFT-LCD polarizing film has defects or not based on an adaptive threshold value. The performance of the proposed method has been evaluated on real TFT-LCD polarizing film samples.

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Bartlomiej Beliczynski Andrzej Dzielinski Marcin Iwanowski Bernardete Ribeiro

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© 2007 Springer Berlin Heidelberg

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Sohn, SW., Lee, DY., Choi, H., Suh, JW., Bae, HD. (2007). Detection of Various Defects in TFT-LCD Polarizing Film. In: Beliczynski, B., Dzielinski, A., Iwanowski, M., Ribeiro, B. (eds) Adaptive and Natural Computing Algorithms. ICANNGA 2007. Lecture Notes in Computer Science, vol 4432. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-71629-7_60

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  • DOI: https://doi.org/10.1007/978-3-540-71629-7_60

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-71590-0

  • Online ISBN: 978-3-540-71629-7

  • eBook Packages: Computer ScienceComputer Science (R0)

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