Abstract
A design method of associative memory model with expecting fault-tolerant field is proposed.The benefit of this method is to make the designed associative memory model memory sample fault-tolerant field which implements the hoped situation. For any different P samples in n dimensional binary information space D n = [1, − 1]n and any the p compartmentalization C 1,C 2,...,C p of D n, an associative memory model with expecting fault-tolerant field C 1,C 2,...,C p can be designed by the method. The method better solves the difficult synthesis problems of associative memory models.
Supported by the National Natural Foundation of China No.60673101 and 863 Project of China (No.2006AA04Z110, 2006AA01Z123).
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Yang, G., Wang, S., Yan, Q. (2007). A Design Method of Associative Memory Model with Expecting Fault-Tolerant Field. In: Liu, D., Fei, S., Hou, Z., Zhang, H., Sun, C. (eds) Advances in Neural Networks – ISNN 2007. ISNN 2007. Lecture Notes in Computer Science, vol 4493. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-72395-0_76
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DOI: https://doi.org/10.1007/978-3-540-72395-0_76
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