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A Fuzzy-Neural Approach with BPN Post-classification for Job Completion Time Prediction in a Semiconductor Fabrication Plant

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Analysis and Design of Intelligent Systems using Soft Computing Techniques

Part of the book series: Advances in Soft Computing ((AINSC,volume 41))

Abstract

Predicting the completion time of a job is a critical task to a semiconductor fabrication plant. Many recent studies have shown that pre-classifying a job before predicting the completion time was beneficial to prediction accuracy. However, most classification approaches applied in this field could not absolutely classify jobs. Besides, whether the pre-classification approach combined with the subsequent prediction approach was suitable for the data was questionable. For tackling these problems, a fuzzy-neural approach with back-propagation-network (BPN) post-classification is proposed in this study, in which a job is post-classified with some BPNs instead after predicting its completion time with a fuzzy BPN (FBPN). In this novel way, only jobs which estimated completion times are the same accurate will be clustered into the same category. To evaluate the effectiveness of the proposed methodology, production simulation is applied to generate test data. According to experimental results, post-classifying jobs might be very effective in enhancing the accuracy of job completion time prediction in a semiconductor fabrication plant.

This work was support by the National Science Council, R.O.C.

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References

  1. Barman, S.: The Impact of Priority Rule Combinations on Lateness and Tardiness. IIE Transactions 30, 495–504 (1998)

    Article  Google Scholar 

  2. Chang, P.-C., Hsieh, J.-C.: A Neural Networks Approach for Due-date Assignment in a Wafer Fabrication Factory. International Journal of Industrial Engineering 10(1), 55–61 (2003)

    MathSciNet  Google Scholar 

  3. Chang, P.-C., Hsieh, J.-C., Liao, T.W.: A Case-based Reasoning Approach for Due Date Assignment in a Wafer Fabrication Factory. In: Aha, D.W., Watson, I. (eds.) ICCBR 2001. LNCS (LNAI), vol. 2080, Springer, Heidelberg (2001)

    Google Scholar 

  4. Chang, P.-C., Hsieh, J.-C., Liao, T.W.: Evolving Fuzzy Rules for Due-date Assignment Problem in Semiconductor Manufacturing Factory. Journal of Intelligent Manufacturing 16, 549–557 (2005)

    Article  Google Scholar 

  5. Chen, T.: A Fuzzy Back Propagation Network for Output Time Prediction in a Wafer Fab. Applied Soft Computing 2(3F), 211–222 (2003)

    Article  Google Scholar 

  6. Chen, T.: A Fuzzy Set Approach for Evaluating the Achievability of an Output Time Forecast in a Wafer Fabrication Plant. In: Gelbukh, A., Reyes-Garcia, C.A. (eds.) MICAI 2006. LNCS (LNAI), vol. 4293, pp. 483–493. Springer, Heidelberg (2006)

    Chapter  Google Scholar 

  7. Chen, T.: A Hybrid Look-ahead SOM-FBPN and FIR System for Wafer-lot-output Time Prediction and Achievability Evaluation. International Journal of Advanced Manufacturing Technology (2007), doi:10.1007/s00170-006-0741-x

    Google Scholar 

  8. Chen, T.: A Hybrid SOM-BPN Approach to Lot Output Time Prediction in a Wafer Fab. Neural Processing Letters 24(3), 271–288 (2006)

    Article  Google Scholar 

  9. Chen, T.: A Look-ahead Fuzzy Back Propagation Network for Lot Output Time Series Prediction in a Wafer Fab. In: King, I., et al. (eds.) ICONIP 2006. LNCS, vol. 4234, pp. 974–982. Springer, Heidelberg (2006)

    Chapter  Google Scholar 

  10. Chen, T.: Applying an Intelligent Neural System to Predicting Lot Output Time in a Semiconductor Fabrication Factory. In: King, I., et al. (eds.) ICONIP 2006. LNCS, vol. 4234, pp. 581–588. Springer, Heidelberg (2006)

    Chapter  Google Scholar 

  11. Chen, T., Jeang, A., Wang, Y.-C.: A Hybrid Neural Network and Selective Allowance Approach for Internal Due Date Assignment in a Wafer Fabrication Plant. International Journal of Advanced Manufacturing Technology (2007), doi:10.1007/s00170-006-0869-8

    Google Scholar 

  12. Chen, T., Lin, Y.-C.: A Hybrid and Intelligent System for Predicting Lot Output Time in a Semiconductor Fabrication Factory. In: Greco, S., et al. (eds.) RSCTC 2006. LNCS (LNAI), vol. 4259, pp. 757–766. Springer, Heidelberg (2006)

    Chapter  Google Scholar 

  13. Chung, S.-H., Yang, M.-H., Cheng, C.-M.: The Design of Due Date Assignment Model and the Determination of Flow Time Control Parameters for the Wafer Fabrication Factories. IEEE Transactions on Components, Packaging, and Manufacturing Technology – Part C 20(4), 278–287 (1997)

    Article  Google Scholar 

  14. Foster, W.R., Gollopy, F., Ungar, L.H.: Neural Network Forecasting of Short, Noisy Time Series. Computers in Chemical Engineering 16(4), 293–297 (1992)

    Article  Google Scholar 

  15. Goldberg, D.E.: Genetic Algorithms in Search, Optimization, and Machine Learning. Addison-Wesley, Reading (1989)

    MATH  Google Scholar 

  16. Hung, Y.-F., Chang, C.-B.: Dispatching Rules Using Flow Time Predictions for Semiconductor Wafer Fabrications. In: Proceedings of the 5th Annual International Conference on Industrial Engineering Theory, Applications and Practice, Taiwan (2001)

    Google Scholar 

  17. Ishibuchi, H., Nozaki, K., Tanaka, H.: Distributed Representation of Fuzzy Rules and Its Application to Pattern Classification. Fuzzy Sets and Systems 52(1), 21–32 (1992)

    Article  Google Scholar 

  18. Lin, C.-Y.: Shop Floor Scheduling of Semiconductor Wafer Fabrication Using Real-time Feedback Control and Prediction. Ph.D. Dissertation, Engineering-Industrial Engineering and Operations Research, University of California at Berkeley (1996)

    Google Scholar 

  19. Piramuthu, S.: Theory and Methodology – Financial Credit-risk Evaluation with Neural and Neuralfuzzy Systems. European Journal of Operational Research 112, 310–321 (1991)

    Article  Google Scholar 

  20. Ragatz, G.L., Mabert, V.A.: A Simulation Analysis of Due Date Assignment. Journal of Operations Management 5, 27–39 (1984)

    Article  Google Scholar 

  21. Vig, M.M., Dooley, K.J.: Dynamic Rules for Due-date Assignment. International Journal of Production Research 29(7), 1361–1377 (1991)

    Article  Google Scholar 

  22. Wang, L.-X., Mendel, J.M.: Generating Fuzzy Rules by Learning from Examples. IEEE Transactions on Systems, Man, and Cybernetics 22(6), 1414–1427 (1992)

    Article  MathSciNet  Google Scholar 

  23. Weeks, J.K.: A Simulation Study of Predictable Due-dates. Management Science 25, 363–373 (1979)

    Article  MATH  Google Scholar 

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Patricia Melin Oscar Castillo Eduardo Gomez Ramírez Janusz Kacprzyk Witold Pedrycz

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Chen, T. (2007). A Fuzzy-Neural Approach with BPN Post-classification for Job Completion Time Prediction in a Semiconductor Fabrication Plant. In: Melin, P., Castillo, O., Ramírez, E.G., Kacprzyk, J., Pedrycz, W. (eds) Analysis and Design of Intelligent Systems using Soft Computing Techniques. Advances in Soft Computing, vol 41. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-72432-2_59

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  • DOI: https://doi.org/10.1007/978-3-540-72432-2_59

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-72431-5

  • Online ISBN: 978-3-540-72432-2

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