Abstract
Outliers, defined as data samples markedly different from the rest of their kind, play an important role in modern pattern recognition and data analysis systems. Outlier treatment usually invokes reasoning about the unknown (irregular) using concepts and features pertaining to the known (regular) samples, naturally requires tools for handling uncertainty or ambiguity, incorporates multi-layered approximate reasoning structures, and often relies on an external background knowledge source. Granular Computing and Rough Set theories provide excellent methods and frameworks for such tasks. In this article, we discuss methods for the detection and evaluation of outliers, as well as how to elicit background domain knowledge from outliers using multi-level approximate reasoning schemes.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Aggarwal, C.C., Yu, P.S.: Outlier detection for high dimensional data. In: Charu, C. (ed.) Proceedings of the 2001 ACM SIGMOD International Conference on Management of Data, pp. 37–46. ACM Press, New York (2001)
Breunig, M.M., Kriegel, H.-P., Ng, R.T., Sander, J.: Lof: identifying density-based local outliers. SIGMOD Rec. 29(2), 93–104 (2000)
Fensel, D.: Ontologies: A Silver Bullet for Knowledge Management and Electronic Commerce, Secaucus, NJ. Springer, New York (2003)
Hodge, V., Austin, J.: A survey of outlier detection methodologies. Artif. Intell. Rev. 22(2), 85–126 (2004)
Jiang, F., Sui, Y., Cao, C.: Outlier detection using rough set theory. In: Ślęzak, D., Wang, G., Szczuka, M., Düntsch, I., Yao, Y. (eds.) RSFDGrC 2005. LNCS (LNAI), vol. 3641, pp. 79–87. Springer, Heidelberg (2005)
Knorr, E.M.: Outliers and Data Mining: Finding Exceptions in Data. PhD thesis, University of British Columbia (April 2002)
Knorr, E.M., Ng, R.T.: Finding intensional knowledge of distance-based outliers. In: Edwin, M. (ed.) VLDB ’99. Proceedings of the 25th International Conference on Very Large Data Bases, San Francisco, CA, pp. 211–222. Morgan Kaufmann Publishers, San Francisco (1999)
Knorr, E.M., Ng, R.T., Tucakov, V.: Distance-based outliers: Algorithms and applications. The VLDB Journal 8(3), 237–253 (2000)
Mitchell, T.M.: Machine Learning. McGraw-Hill, New York (1997)
Nguyen, T.T.: Eliciting domain knowledge in handwritten digit recognition. In: Pal, S.K., Bandyopadhyay, S., Biswas, S. (eds.) PReMI 2005. LNCS, vol. 3776, pp. 762–767. Springer, Heidelberg (2005)
Oliveira, L.S., Sabourin, R., Bortolozzi, F., Suen, C.Y.: Feature selection using multi-objective genetic algorithms for handwritten digit recognition. In: ICPR02. International Conference on Pattern Recognition, vol. I, pp. 568–571 (2002)
Pawlak, Z.: Rough Sets: Theoretical Aspects of Reasoning about Data. Kluwer Academic Publishers, Norwell, MA (1992)
Pedrycz, W. (ed.): Granular computing: an emerging paradigm, Germany. Physica-Verlag GmbH, Heidelberg (2001)
Polkowski, L., Skowron, A.: Rough mereology: A new paradigm for approximate reasoning. Journal of Approximate Reasoning 15(4), 333–365 (1996)
Polkowski, L., Skowron, A.: Constructing rough mereological granules of classifying rules and classifying algorithms. In: Bouchon-Meunier, B., et al. (eds.) Technologies for Constructing Intelligent Systems I, pp. 57–70. Physica-Verlag, Heidelberg (2002)
Skowron, A.: Rough sets in perception-based computing. In: Pal, S.K., Bandyopadhyay, S., Biswas, S. (eds.) PReMI 2005. LNCS, vol. 3776, Springer, Heidelberg (2005)
Zadeh, L.A.: From imprecise to granular probabilities. Fuzzy Sets. and Systems 154(3), 370–374 (2005)
Author information
Authors and Affiliations
Editor information
Rights and permissions
Copyright information
© 2007 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Nguyen, T.T. (2007). Outlier Detection: An Approximate Reasoning Approach. In: Kryszkiewicz, M., Peters, J.F., Rybinski, H., Skowron, A. (eds) Rough Sets and Intelligent Systems Paradigms. RSEISP 2007. Lecture Notes in Computer Science(), vol 4585. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-73451-2_52
Download citation
DOI: https://doi.org/10.1007/978-3-540-73451-2_52
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-73450-5
Online ISBN: 978-3-540-73451-2
eBook Packages: Computer ScienceComputer Science (R0)