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On the Connection Between the Phase Transition of the Covering Test and the Learning Success Rate

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Book cover Inductive Logic Programming (ILP 2006)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 4455))

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Abstract

To investigate the impact of the occurrence of a phase transition (PT) in the covering test on the learning success rate, systematic experiments with several learning algorithms have been conducted on a large set of artificially generated problems by Botta et al. [3]. The authors generated a set of 451 problems by choosing each target concept according to its location in the (m,L) plane with respect to the PT. The “yes”, “no” and “pt” regions are uniformly visited by varying (m,L) pairs without replacement (m ranges in [5,30] and L ranges in [12,40]). One important conclusion of their work is that the occurrence of a PT in the covering test is a general problem for all learning algorithms: the PT is viewed as an attractor for the heuristic search of any learning algorithms, which are bound to find a concept definition in the PT. Moreover, for all tested learners, there exists a failure region, starting from the “pt” region to the beginning of the “no” region, where the learnt theories are seemingly randomly constructed, with no better predictive accuracy than random guessing.

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References

  1. Alphonse, E., Osmani, A.: On the connection between the phase transition of the covering test and the learning success rate. Journal of Machine Learning (submitted, 2007)

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  2. Alphonse, E., Rouveirol, C.: Extension of the top-down data-driven strategy to ILP. In: Etalle, S., Truszczyński, M. (eds.) ICLP 2006. LNCS, vol. 4079, Springer, Heidelberg (2006)

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  3. Botta, M., Giordana, A., Saitta, L., Sebag, M.: Relational learning as search in a critical region. Journal of Machine Learning Research 4, 431–463 (2003)

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  4. Winston, P.H.: Learning structural descriptions form examples. In: Winston, P.H. (ed.) The Psychology of Computer Vision, pp. 157–209. McGraw-Hill, New York (1975)

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Stephen Muggleton Ramon Otero Alireza Tamaddoni-Nezhad

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© 2007 Springer-Verlag Berlin Heidelberg

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Alphonse, E., Osmani, A. (2007). On the Connection Between the Phase Transition of the Covering Test and the Learning Success Rate. In: Muggleton, S., Otero, R., Tamaddoni-Nezhad, A. (eds) Inductive Logic Programming. ILP 2006. Lecture Notes in Computer Science(), vol 4455. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-73847-3_6

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  • DOI: https://doi.org/10.1007/978-3-540-73847-3_6

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-73846-6

  • Online ISBN: 978-3-540-73847-3

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