Abstract
Information about current quality state enables large improvements in the dynamic planning for the logistics of fresh products. The main reason for quality losses are temperature deviations. This article investigates how a prediction system that delivers a shelf life prediction at each transhipment point could be integrated into a semi-passive RFID label. Limiting factors for the possible predictions accuracy like model tolerances and the bound processing resources of low-power microcontrollers will be evaluated.
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Jedermann, R., Emond, JP., Lang, W. (2008). Shelf Life Prediction by Intelligent RFID – Technical Limits of Model Accuracy. In: Kreowski, HJ., Scholz-Reiter, B., Haasis, HD. (eds) Dynamics in Logistics. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-76862-3_22
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DOI: https://doi.org/10.1007/978-3-540-76862-3_22
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-76861-6
Online ISBN: 978-3-540-76862-3
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