Summary
Distributed computing attempts to aggregate different computing resources available in enterprises and in the Internet for computation intensive applications in a transparent and scalable way. Digital test generation aims to find minimal set of test vectors to obtain maximum fault coverage for digital electronic circuits. In this paper we focus on distributed environment and parallelization of the computationally intensive genetic algorithm based test generation for sequential circuits. We discuss the concept and implementation of our system infrastructure, task partitioning, allocation, test generation algorithm and results.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
ITRS roadmap (2006), http://public.itrs.net/
Schneider, A., et al.: Internet-based Collaborative Test Generation with MOSCITO. In: Proc. DATE 2002, Paris, France, pp. 221–226 (2002)
Ivask, E., Raik, J., Ubar, R., Schneider, A.: WEB-Based Environment: Remote Use of Digital Electronics Test Tools. In: Proc. IFIP 18th World Computer Congress: Virtual Enterprises and Collaborative Networks, Toulouse, France. Kluwer Academic Publishers, Dordrecht (2004)
BOINC, http://boinc.berkeley.edu/
Teo, Y.M., Low, S.C., Tay, S.C., Gozali, J.P.: Distributed Geo-rectification of Satellite Images using Grid Computing. In: Proc. International Parallel and Distributed Processing Symposium IPDPS 2003 (2003)
Goldberg: Genetic algorithms. Addison-Wesley, USA (1991)
McGeer, P., McMillan, K., Saldanha, A., Sangiovanni-Vincetelli, A., Scaglia, P.: Fast discrete function evaluation using decision diagrams. In: Proc. ICCAD 1995, pp. 402–407 (1995)
Minato, S.: Binary Decision Diagrams and Applications for VLSI CAD. Kluwer Academic Publishers, Dordrecht (1996)
Ivask, E., Raik, J., Ubar, R.: Fault Oriented Test Pattern Generation for Sequential Circuits Using Genetic Algorithms. In: Proc. IEEE European Test Workshop, Cascais, Portugal, pp. 319–320 (2000)
Author information
Authors and Affiliations
Editor information
Rights and permissions
Copyright information
© 2008 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Ivask, E., Raik, J., Ubar, R. (2008). Distributed Approach for Genetic Test Generation in the Field of Digital Electronics. In: Badica, C., Mangioni, G., Carchiolo, V., Burdescu, D.D. (eds) Intelligent Distributed Computing, Systems and Applications. Studies in Computational Intelligence, vol 162. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85257-5_13
Download citation
DOI: https://doi.org/10.1007/978-3-540-85257-5_13
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-85256-8
Online ISBN: 978-3-540-85257-5
eBook Packages: EngineeringEngineering (R0)