Abstract
In previous work, the authors presented a theoretical lower bound on the required number of testing runs for performance testing of digital forensic tools. We also demonstrated a practical method of testing showing how to tolerate both measurement and random errors in order to achieve results close to this bound. In this paper, we extend the previous work to the situation of correctness testing.
The contribution of this methodology enables the tester to achieve correctness testing results of high quality from a manageable number of observations and in a dynamic but controllable way. This is of particular interest to forensic testers who do not have access to sophisticated equipment and who can allocate only a small amount of time to testing.
The original version of this chapter was revised: The copyright line was incorrect. This has been corrected. The Erratum to this chapter is available at DOI: 10.1007/978-3-642-02312-5_25
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References
Beckett, J., Slay, J.: Digital Forensics: Validation and Verification in a Dynamic Work Environment. In: Proceedings of the 40th Annual Hawaii International Conference on System Sciences (HICSS 2007), p. 266a (2007)
CFTT group from NIST. Disk Imaging Specifications. NIST technial report (2001)
CFTT group from NIST. Digital Data Acquisition Tool Specification. NIST technial report (2004)
CFTT group from NIST. Digital Data Acquisition Tool Test Assertions and Test Plan. NIST technial report (2005)
Digital Forensics Research Workshop. DFRWS06 Forensic Challenge, http://www.dfrws.org/2006/challenge/index.shtml
Brian Carrier. Digital Forensics Tool Testing Images, http://dftt.sourceforge.net/
Hedayat, A.S., Sloane, N.J.A., Stufken, J.: Orthogonal Arrays: Theory and Applications. Springer, Heidelberg (1999)
NIST/SEMATECH. e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/
Mohay, G.: Technical Challenges and Directions for Digital Forensics. In: Proceedings of the 1st International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE 2005), pp. 155–161 (2005)
Pan, L., Batten, L.M.: A Lower Bound on Effective Performance Testing for Digital Forensic Tools. In: Proceedings of the 2nd International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE 2007), pp. 117–130 (2007)
Pan, L.: A Performance Testing Framework for Digital Forensic Tools. PhD thesis Deakin University (2007)
Sloane, N.J.A.: A Library of Orthogonal Arrays, http://www.research.att.com/~njas/oadir/index.html
Taguchi, G.: Introduction to Quality Engineering: Designing Quality Into Produces and Processes. White Plains (1986)
Taguchi, G., Chowdhury, S., Wu, Y.: Taguchi’s Quality Engineering Handbook. Wiley, Chichester (2004)
Wilsdon, T., Slay, J.: Digital Forensics: Exploring Validation, Verification and Certification. In: Proceedings of the 1st International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE 2005), pp. 48–55 (2005)
Youden, W.J.: Statistical techniques for collaborative tests. In: Statistical Manual of the Association of Official Analytical Chemists, p. v–63 (1975)
Zhou, J., Zhu, H.: Robust Estimation and Design Procedures for the Random Effects Model. The Canadian Journal of Statistics 31(1), 99–110 (2003)
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© 2009 ICST Institute for Computer Science, Social Informatics and Telecommunications Engineering
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Pan, L., Batten, L.M. (2009). Robust Correctness Testing for Digital Forensic Tools. In: Sorell, M. (eds) Forensics in Telecommunications, Information and Multimedia. e-Forensics 2009. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, vol 8. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-02312-5_7
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DOI: https://doi.org/10.1007/978-3-642-02312-5_7
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