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Outlier Detection with Explanation Facility

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Machine Learning and Data Mining in Pattern Recognition (MLDM 2009)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 5632))

Abstract

We propose a simple and efficient method to detect exceptional data, which includes a novel end user explanation facility. After various designs, the best was based on an unsupervised learning schema, which uses an adaptation of the artificial neural network paradigm ART for the cluster task. In our method, the cluster that contains the smaller number of instances is considered as outlier data. The method provides an explanation to the end user about why this cluster is exceptional with regard to the data universe. The proposed method has been tested and compared successfully not only with well-known academic data, but also with a real and very large financial database that contains attributes with numerical and categorical values.

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© 2009 Springer-Verlag Berlin Heidelberg

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Mejía-Lavalle, M., Sánchez Vivar, A. (2009). Outlier Detection with Explanation Facility. In: Perner, P. (eds) Machine Learning and Data Mining in Pattern Recognition. MLDM 2009. Lecture Notes in Computer Science(), vol 5632. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-03070-3_34

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  • DOI: https://doi.org/10.1007/978-3-642-03070-3_34

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-03069-7

  • Online ISBN: 978-3-642-03070-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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