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Local Feature Selection for the Relevance Vector Machine Using Adaptive Kernel Learning

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Book cover Artificial Neural Networks – ICANN 2009 (ICANN 2009)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 5768))

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Abstract

A Bayesian learning algorithm is presented that is based on a sparse Bayesian linear model (the Relevance Vector Machine (RVM)) and learns the parameters of the kernels during model training. The novel characteristic of the method is that it enables the introduction of parameters called ‘scaling factors’ that measure the significance of each feature. Using the Bayesian framework, a sparsity promoting prior is then imposed on the scaling factors in order to eliminate irrelevant features. Feature selection is local, because different values are estimated for the scaling factors of each kernel, therefore different features are considered significant at different regions of the input space. We present experimental results on artificial data to demonstrate the advantages of the proposed model and then we evaluate our method on several commonly used regression and classification datasets.

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References

  1. Tzikas, D., Likas, A., Galatsanos, N.: Sparse bayesian modeling with adaptive kernel learning. IEEE Transactions on Neural Networks (to appear)

    Google Scholar 

  2. Tipping, M.E.: Sparse Bayesian learning and the relevance vector machine. Journal of Machine Learning Research 1, 211–244 (2001)

    MathSciNet  MATH  Google Scholar 

  3. Schmolck, A., Everson, R.: Smooth relevance vector machine: a smoothness prior extension of the RVM. Machine Learning 68(2), 107–135 (2007)

    Article  Google Scholar 

  4. Tipping, M.E., Faul, A.: Fast marginal likelihood maximisation for sparse Bayesian models. In: Proceedings of the Ninth International Workshop on Artificial Intelligence and Statistics (2003)

    Google Scholar 

  5. Krishnapuram, B., Hartemink, A.J., Figueiredo, M.A.T.: A Bayesian approach to joint feature selection and classifier design. IEEE Transactions on Pattern Analysis and Machine Intelligence 26(9), 1105–1111 (2004)

    Article  Google Scholar 

  6. Holmes, C.C., Denison, D.G.T.: Bayesian wavelet analysis with a model complexity prior. In: Bernardo, J.M., Berger, J.O., Dawid, A.P., Smith, A.F.M. (eds.) Bayesian Statistics 6: Proceedings of the Sixth Valencia International Meeting. Oxford University Press, Oxford (1999)

    Google Scholar 

  7. Bishop, C.M.: Pattern Recognition and Machine Learning. Springer, Heidelberg (2006)

    MATH  Google Scholar 

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© 2009 Springer-Verlag Berlin Heidelberg

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Tzikas, D., Likas, A., Galatsanos, N. (2009). Local Feature Selection for the Relevance Vector Machine Using Adaptive Kernel Learning. In: Alippi, C., Polycarpou, M., Panayiotou, C., Ellinas, G. (eds) Artificial Neural Networks – ICANN 2009. ICANN 2009. Lecture Notes in Computer Science, vol 5768. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-04274-4_6

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  • DOI: https://doi.org/10.1007/978-3-642-04274-4_6

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-04273-7

  • Online ISBN: 978-3-642-04274-4

  • eBook Packages: Computer ScienceComputer Science (R0)

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